Dr. Yongfu Wen
Research Fellow at Nanyang Technological Univ
SPIE Involvement:
Author
Area of Expertise:
Interferometry , Optical testing , digital holographic microscopy , 3-D measurement , Phase retrieval
Publications (16)

SPIE Journal Paper | 27 July 2022
OE, Vol. 61, Issue 07, 073105, (July 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.7.073105
KEYWORDS: Resistance, Speckle, Optical engineering, Edge detection, Digital holography, Interferometry, Error analysis, Iterative methods, Holography, Denoising

SPIE Journal Paper | 27 February 2020
Weizhe Cheng, Haobo Cheng, Yongfu Wen, Yunpeng Feng, Yan Guo, Min Hu
OE, Vol. 59, Issue 02, 024112, (February 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.2.024112
KEYWORDS: Charge-coupled devices, Autocollimation, Reflectors, Optical engineering, Signal to noise ratio, Image segmentation, Optical testing, Collimation, Laser beam propagation, Fluctuations and noise

Proceedings Article | 24 July 2018 Paper
Yongfu Wen, Haobo Cheng, Yumin Wu, Qihui Pan, Xin Chen, Chao Gao
Proceedings Volume 10827, 108270O (2018) https://doi.org/10.1117/12.2500357
KEYWORDS: Digital holography, Holograms, Holography, Microscopes, 3D image reconstruction, Microscopy, Holography applications

Proceedings Article | 17 July 2015 Paper
Proceedings Volume 9524, 95242M (2015) https://doi.org/10.1117/12.2190197
KEYWORDS: Digital holography, Holography, Microscopes, Holograms, Microelectromechanical systems, 3D image processing, 3D microstructuring, Microscopy, Charge-coupled devices, Fiber couplers

Proceedings Article | 17 July 2015 Paper
Proceedings Volume 9524, 95242J (2015) https://doi.org/10.1117/12.2189703
KEYWORDS: Digital holography, Phase measurement, Holograms, Wafer-level optics, Digital recording, Phase imaging, Wavefronts, Microscopes, Cameras, Inspection

Showing 5 of 16 publications
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