Dr. Yu-lian Cao
at Institute of Semiconductors CAS
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 November 2010 Paper
Yu-Lian Cao, Peng-Fei Xu, Hai-Ming Ji, Tao Yang, Liang-Hui Chen
Proceedings Volume 7844, 784404 (2010) https://doi.org/10.1117/12.869637
KEYWORDS: Temperature metrology, Laser damage threshold, Quantum dots, Laser stabilization, Waveguides, Semiconductor lasers, Optical filters, Semiconducting wafers, Thermal effects, Laser development

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