X-ray absorption fine structure (XAFS) is an important tool for materials information of atoms with bond length, coordination numbers and electronic state. Most of the related research has been performed at the synchrotron radiation facility for past decades. The development of conventional X-ray source and bent crystal analyzer makes it possible to conduct XAFS experiment in the laboratory. We developed a laboratory X-ray absorption spectrometer. It includes an conventional X-ray source, a Johann-type spherically bent crystal analyzer, precision Rowland circle scanning mechanism, and a silicon drift detector. The spectrometer is designed for both the X-ray absorption near-edge structure (XANES) and the extended X-ray absorption fine structure (EXAFS) analysis. The spectrometer covers the photon energy range of 8.9 – 9.6 keV and the energy resolution is about 1.2 – 3.5 eV with W anode source (spot size 0.4 mm) and Ge(800) crystal. The absorption spectrum of a copper foil with thickness of 10 μm is measured. The result is similar to that conducted at the synchrotron radiation facility.
X-ray sources are widely used in non-destructive testing applications. The focal spot shape and size of an X-ray source are important factors that influence the resolution and contrast of images. A monochromatic imaging method using a spherically bent crystal is proposed to measure the focal spot size of X-ray sources. The natural emission spectral lines of the target material are imaged to distinguish the target from the substrate. Thus, the fine structures of the focal spot can be measured combined with high spatial resolution. With a backlight imaging experiment, the imaging system achieves a high spatial resolution of ~10 μm over a large field of view of 2.5 mm with a narrow energy band of 2 eV at 8.05 keV. The X-ray focal spot size of a laboratory X-ray source with a Cu anode is measured using the spherically bent crystal imaging system and a pinhole camera respectively. The spherically bent crystal imaging system provides high spatial resolution and additional details for the focal spot. Thus, the monochromatic imaging method is applicable for the accurate X-ray source dimension measurement.
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