The roughness of the surface is an important parameter that reflects the quality of the object. Optical methods are the
usual ways to measure the surface roughness including scattering method, speckle method, interferometric method and
optical stylus method. But they are highly required the precision of the mechanism and they are not convenient to realize
the automatic measurement. To improve the structure and the automatic performance, this surface roughness
measurement system is based on the theory of two-dimensional phase unwrapping that is widely used in
aerophotogrammetry. With the theory, the three dimensional data can be calculated from the images detected. The
difference is that the image is captured by radar in aerophotogrammetrytly while it is got by using optical structure in this
system. The images are got through the optical structure with the structured light. To control the phase of the light, the
gratings is used in the system controlled by the piezoelectric ceramics. The phase information is contained in the image
and captured by the CCD camera. To analyze the images captured through the optical system, the phase should be
extracted from the images through complex operation to generate the phase map. The quality-guided algorithm is the
main algorithm in this system. LabVIEW is the main software development environment and the massive calculation is
accomplished in the dynamic linked library complied by Visual C++ to realize the image processing. Through the
stereogram showed in the software we can clearly get the three dimensional information of the surface.
Warp and weft density is commonly considered as one of the most important index for estimating the quality of fabrics.
However, the detecting method adopted is basically base on manually counting. It is rather inefficient. This article
demonstrates how to construct efficient system to achieve automatically detection. Fabric is first coupled into the image
sensor by a specific optical system, whose resolution matching is carefully designed. And other component parameters
are also well considered. What is more, the system contains a light source to provide uniformed illumination. A circuit
board with camera module is constructed to perform the role of image processing platform. With amazingly agile
performance provide by an ARM920T processor, and featuring an incredible breadth of peripheral interfaces, the
platform is well suit for fabric density detection. The periodicity within the captured image furnishes convenience for
analysis in frequency domain. After FFT the intensity peaks ranked orderly around the original point. However, the peaks
in the spectrum are always blurred by severe interference whose form is usually an image or a pattern on the fabric. For
this reason, a specific algorithm should be worked out to erode the peaks from the blurred edge to the center. Sometimes,
the central peak is so severely blurred and the central peak is actually useless for us, a unique algorithm is employed to
kick off the central peak. By this way, the position of the surround peaks can be easily located. And the density can also
be easily worked out.
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