Zhuangzhuang Deng
at Nanjing Univ of Information Science & Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 December 2020 Poster + Paper
Proceedings Volume 11445, 1144554 (2020) https://doi.org/10.1117/12.2576177
KEYWORDS: Large telescopes, Process modeling, Computing systems, Sensors, Reliability, Inspection, Device simulation

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