Adel Merdassi
at McGill Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 March 2014 Paper
A. Merdassi, Y. Wang, G. Xereas, V. Chodavarapu
Proceedings Volume 8973, 89730O (2014) https://doi.org/10.1117/12.2037344
KEYWORDS: Sensors, Capacitance, Temperature metrology, Microsystems, Silicon carbide, Californium, Transistors, Resistors, Amorphous silicon, Sputter deposition

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