Prof. Jietao Liu Profile

Prof. Jietao Liu

at Xidian Univ

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 18 November 2019 Paper

Lensless wide-field imaging and depth sensing through a turbid scattering layer by round-trip field estimation

Wei Li, Jietao Liu, Yuxiang Wu, Chengfei Guo, Shunfu He, Ting Ji, Jinjin Zhu, Xiaopeng Shao

Proceedings Volume 11187, 111870E (2019) https://doi.org/10.1117/12.2538906

KEYWORDS: Diffusers, Cameras, Calibration, 3D modeling, Data modeling, Light scattering, Scattering, Scattering media, 3D acquisition, 3D image processing

Read Abstract +

SPIE Journal Paper | 10 December 2016

Focusing of light through turbid media by curve fitting optimization

Changmei Gong, Tengfei Wu, Jietao Liu, Huijuan Li, Xiaopeng Shao, Jianqi Zhang

OE, Vol. 55, Issue 12, 123105, (December 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.12.123105

KEYWORDS: Signal to noise ratio, Modulation, Spatial light modulators, Wavefronts, Sensors, Phase shift keying, Feedback signals, Light scattering, Optimization (mathematics), Computer simulations

Read Abstract +

SPIE Journal Paper | 11 May 2016

Total variation optimization for imaging through turbid media with transmission matrix

Changmei Gong, Xiaopeng Shao, Tengfei Wu, Jietao Liu, Jianqi Zhang

OE, Vol. 55, Issue 12, 121703, (May 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.12.121703

KEYWORDS: Signal to noise ratio, Image restoration, Sensors, Reconstruction algorithms, Detection and tracking algorithms, Speckle, Scattering, Image quality, Light scattering, Optical engineering

Read Abstract +

SPIE Journal Paper | 30 November 2015

High-efficiency imaging through scattering media in noisy environments via sparse image reconstruction

Tengfei Wu, Xiaopeng Shao, Changmei Gong, Huijuan Li, Jietao Liu

OE, Vol. 54, Issue 11, 113111, (November 2015) https://doi.org/10.1117/12.10.1117/1.OE.54.11.113111

KEYWORDS: Scattering, Imaging systems, Scattering media, Light scattering, Image restoration, Speckle pattern, Signal to noise ratio, Image processing, Optical engineering, Fringe analysis

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years