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Longlong Wang
at NIM
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Publications (1)
Proceedings Article | 10 October 2013 Paper
Simulation and signal analysis of Akiyama probe applied to atomic force microscope
Proceedings Volume 8916, 89160W (2013) https://doi.org/10.1117/12.2035726
KEYWORDS: Finite element methods, Sensors, Atomic force microscope, Feedback signals, Capacitance, Atomic force microscopy, Signal analysis, Calibration, Electrodes, Amplifiers
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