Sean Archer
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 May 2015 Paper
Proceedings Volume 9472, 947215 (2015) https://doi.org/10.1117/12.2177683
KEYWORDS: Aluminum, Bidirectional reflectance transmission function, Contamination, Statistical modeling, Sensors, Data modeling, Temperature metrology, Infrared radiation, Thermal modeling, Digital imaging

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