Dr. Zhanli Hu
at Shenzhen Institutes of Advanced Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 March 2019 Paper
Proceedings Volume 10948, 1094836 (2019) https://doi.org/10.1117/12.2511818
KEYWORDS: Computed tomography, Gallium nitride, X-ray computed tomography, Image quality, Neural networks, Head, Image quality standards, Biomedical optics, Data acquisition, Algorithm development

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