Presentation + Paper
8 March 2024 Longitudinal optical (LO) and LO-like phonon resonant mid-infrared radiation emission and absorption by surface micro-structures on III-nitrides
Author Affiliations +
Abstract
Longitudinal optical-like phonon resonant mid-infrared emission (LORE) and absorption peaks of micro-surface line and space structures of metallic material plates on GaN wafers are observed at 500 – 630 K. The emission peak energy is located in a range of 670 – 730 cm-1 for GaN, which is lower than the LO-phonon energy of approximately 730 cm-1 at 630 K. This feature is contrasted with that of the LO-phonon resonant emission from the Au-GaAs microstructures resonating with the LO phonon. The emission mechanism is clarified using a structure of n++-GaN with an electron density of 1×1020 cm-3 as a metallic material. These emission lines have another notable feature, i.e., the observed peak energies are independent of the polar emission angle, unlike the emissions by surface phonon polaritons showing a significant directive nature of peak energies. The present results show that each peak energy in the emission spectrum is positioned at the zero-point of the real part of the dielectric function comprising the components of the transverse optical phonon and other electric dipoles induced by the LO-like modes, excluding the target mode. This type of emission is also obtained for the structures of AlxGa1-xN films. These results suggest the feasibility of high-efficiency emission in a range of 670 – 900 cm-1 when the devices are positioned in a cavity with high reflectivity of blackbody-like radiation.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Yoshihiro Ishitani, Bojin Lin, Hnin Lai Lai Aye, Daiki Yoshikawa, Hideto Miyake, Kohei Ueno, and Hiroshi Fujioka "Longitudinal optical (LO) and LO-like phonon resonant mid-infrared radiation emission and absorption by surface micro-structures on III-nitrides", Proc. SPIE 12886, Gallium Nitride Materials and Devices XIX, 1288605 (8 March 2024); https://doi.org/10.1117/12.3000696
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KEYWORDS
Phonons

Gallium nitride

Interfaces

Dielectrics

Mid infrared

Semiconducting wafers

Polarization

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