Paper
12 July 2000 Innovations in IR projector arrays
Barry E. Cole, B. Higashi, Jeff A. Ridley, J. Holmen, K. Newstrom, C. Zins, K. Nguyen, Steven R. Weeres, Burgess R. Johnson, Robert G. Stockbridge, Robert Lee Murrer Jr., Eric M. Olson, Thomas P. Bergin, James R. Kircher, David S. Flynn
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Abstract
In the past year, Honeywell has developed a 512 X 512 snapshot scene projector containing pixels with very high radiance efficiency. The array can operate in both snapshot and raster mode. The array pixels have near black body characteristics, high radiance outputs, broad band performance, and high speed. IR measurements and performance of these pixels will be described. In addition, a vacuum probe station that makes it possible to select the best die for packaging and delivery based on wafer level radiance screening, has been developed and is in operation. This system, as well as other improvements, will be described. Finally, a review of the status of the present projectors and plans for future arrays is included.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Barry E. Cole, B. Higashi, Jeff A. Ridley, J. Holmen, K. Newstrom, C. Zins, K. Nguyen, Steven R. Weeres, Burgess R. Johnson, Robert G. Stockbridge, Robert Lee Murrer Jr., Eric M. Olson, Thomas P. Bergin, James R. Kircher, and David S. Flynn "Innovations in IR projector arrays", Proc. SPIE 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V, (12 July 2000); https://doi.org/10.1117/12.391704
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Cited by 10 scholarly publications.
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KEYWORDS
Raster graphics

Cameras

Semiconducting wafers

Projection systems

Mid-IR

Electronics

Capacitors

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