Mr. R. Lee Murrer Profile

R. Lee Murrer

Senior Systems Engineer at Millennium Engineering and Integration Co

SPIE Involvement:

Editor | Author

Proceedings Article | 4 August 2004 Paper

Synthetic IR signature control using emissivity enhancement techniques

Volodymyr Malyutenko, Oleg Malyutenko, Vyacheslav Bogatyrenko, Sergiy Chyrchyk, James Kircher, Robert Murrer, Donald Snyder

Proceedings Volume 5408, (2004) https://doi.org/10.1117/12.537758

KEYWORDS: Thermography, Visible radiation, Infrared imaging, Absorption, Silicon, Semiconductors, Germanium, Infrared radiation, Projection systems, Infrared signatures

Read Abstract +

Proceedings Article | 31 August 2001 Paper

Development of IR-emitting infrared fibers at the Naval Research Laboratory

L. Brandon Shaw, Brian Cole, Jasbinder Sanghera, Ishwar Aggarwal, Frederic Kung, Shyam Bayya, Reza Mossadegh, Peter Thielen, James Kircher, Robert Lee Murrer

Proceedings Volume 4366, (2001) https://doi.org/10.1117/12.438060

KEYWORDS: Optical fibers, Mid-IR, Long wavelength infrared, Chalcogenide glass, Ions, Glasses, Analytical research, Terbium, Infrared radiation, Prototyping

Read Abstract +

Proceedings Article | 12 July 2000 Paper

Development of a two-color projection system for the KHILS Vacuum Cold Chamber (KVACC)

David Flynn, Steven Marlow, James Kircher, Eric Glattke, Robert Lee Murrer, John Weir

Proceedings Volume 4027, (2000) https://doi.org/10.1117/12.391692

KEYWORDS: Cameras, Projection systems, Staring arrays, Sensors, Imaging systems, Cryogenics, Infrared radiation, Calibration, Control systems, Temperature metrology

Read Abstract +

Proceedings Article | 12 July 2000 Paper

Resolution and dynamic range capabilities of dynamic infrared scene projection systems

Eric Olson, Owen Williams, Robert Lee Murrer, James Kircher

Proceedings Volume 4027, (2000) https://doi.org/10.1117/12.391689

KEYWORDS: Infrared radiation, Nonuniformity corrections, Infrared imaging, Commercial off the shelf technology, Projection systems, RGB color model, Thermography, Mid-IR, Temperature metrology, Transform theory

Read Abstract +

Proceedings Article | 12 July 2000 Paper

Innovations in IR projector arrays

Barry Cole, B. Higashi, Jeff Ridley, J. Holmen, K. Newstrom, C. Zins, K. Nguyen, Steven Weeres, Burgess Johnson, Robert Stockbridge, Robert Lee Murrer, Eric Olson, Thomas Bergin, James Kircher, David Flynn

Proceedings Volume 4027, (2000) https://doi.org/10.1117/12.391704

KEYWORDS: Raster graphics, Cameras, Semiconducting wafers, Projection systems, Mid-IR, Electronics, Capacitors, Annealing, Field effect transistors, Infrared cameras

Read Abstract +

Proceedings Article | 12 July 2000 Paper

Radiometric stability of Phase 3 WISP arrays

David Flynn, Steven Marlow, Thomas Bergin, Robert Lee Murrer

Proceedings Volume 4027, (2000) https://doi.org/10.1117/12.391693

KEYWORDS: Annealing, Cameras, Projection systems, Temperature metrology, Calibration, Black bodies, Transmittance, Sensors, Mid-IR, Infrared radiation

Read Abstract +

Phase 3 WISP arrays and BRITE arrays are currently being used extensively in many projection systems in many different facilities. These arrays have not been annealed at the factory, and previous tests with the arrays have revealed instabilities in the radiometric output when the arrays are driven at higher voltages. In some applications, the instabilities can be avoided by operating the arrays at lower voltages. In many KHILS applications, it is desirable to drive the arrays with the highest possible voltages to simulate hot missile targets. In one KHILS application (the KHILS VAcuum Cold Chamber, KVACC), the arrays are cooled to near cryogenic temperatures and then driven to high voltages. At lower substrate temperatures, the characteristic responses of the emitters change. Thus, it is important that the response and the stability of the radiometric output of the arrays be well understood for various substrate temperatures, and that the arrays either be annealed or operated below the voltage where the emitters begin to anneal. KHILS has investigated annealing procedures in the past, but there was concern that the annealing procedures themselves -- driving the arrays at high voltages for long times -- would damage the arrays. In order to understand the performance of the arrays better, and to reduce risks associated with driving the arrays at high voltages and operating the arrays at low substrate temperatures, a systematic measurement program was initiated. The radiometric output of new Phase 3 WISP arrays was accurately measured as a function of voltage and time. Arrays designated for testing were driven to the higher voltages and the radiometric output was measured for as long as two hours. Curves indicative of the annealing were observed, and it was determined that the maximum stable output without annealing was about 500 K (MWIR apparent temperature). Blocks of emitters were annealed and tested again. It was determined that stable output of as much as 680 K could be obtained with annealed emitters. KHILS personnel worked with Honeywell Technology Center (HTC) to establish annealing procedures that could be done by HTC in the future. Conclusions to date are that once the emitters are sufficiently annealed, their output does not change further with time, except for some small transient effects that will be discussed in the paper.

Proceedings Article | 19 July 1999 Paper

Nonuniformity correction of a resistor array infrared scene projector

Eric Olson, Robert Lee Murrer

Proceedings Volume 3697, (1999) https://doi.org/10.1117/12.352919

KEYWORDS: Resistors, Nonuniformity corrections, Sensors, Cameras, Projection systems, Calibration, Infrared radiation, Imaging infrared seeker, Digital signal processing, Image segmentation

Read Abstract +

Proceedings Article | 19 July 1999 Paper

Developments at the Kinetic Kill Vehicle Hardware-in-the-Loop Simulator (KHILS) facility

Robert Lee Murrer, Rhoe Thompson, Charles Coker

Proceedings Volume 3697, (1999) https://doi.org/10.1117/12.352921

KEYWORDS: Resistors, Sensors, Projection systems, Signal processing, Computing systems, Missiles, Computer simulations, Visualization, LIDAR, Infrared radiation

Read Abstract +

Proceedings Article | 19 July 1999 Paper

Characterization measurements of the wideband infrared scene projector resistor array: III

Lawrence Jones, Robert Lee Murrer, Robert Stockbridge, Virgil Timms, Andrew Guertin

Proceedings Volume 3697, (1999) https://doi.org/10.1117/12.352904

KEYWORDS: Resistors, Annealing, Nonuniformity corrections, Projection systems, Infrared radiation, Cameras, Weapons, Imaging systems, Resistance, Infrared imaging

Read Abstract +

Proceedings Article | 13 July 1998 Paper

Large-area infrared microemitter arrays for dynamic scene projection

Barry Cole, Robert Higashi, Jeff Ridley, J. Holmen, Robert Stockbridge, Robert Lee Murrer, Eddie Burroughs

Proceedings Volume 3368, (1998) https://doi.org/10.1117/12.316356

KEYWORDS: Temperature metrology, Resistance, Field effect transistors, Resistors, Projection systems, Semiconducting wafers, Cryogenics, Electronics, Annealing, Infrared radiation

Read Abstract +

Proceedings Article | 13 July 1998 Paper

Demonstration of KHILS two-color IR projection capability

Lawrence Jones, Jason Coker, Dennis Garbo, Eric Olson, Robert Lee Murrer, Thomas Bergin, George Goldsmith, Dennis Crow, Andrew Guertin, Michael Dougherty, Thomas Marler, Virgil Timms

Proceedings Volume 3368, (1998) https://doi.org/10.1117/12.316367

KEYWORDS: Cameras, Resistors, Calibration, Black bodies, Long wavelength infrared, Optical filters, Reflectivity, Mid-IR, Staring arrays, Projection systems

Read Abstract +

For more than a decade, there has been considerable discussion about using different IR bands for the detection of low contrast military targets. Theory predicts that a target can have little to no contrast against the background in one IR band while having a discernible signature in another IR band. A significant amount of effort has been invested towards establishing hardware that is capable of simultaneously imaging in two IR bands to take advantage of this phenomenon. Focal plane arrays (FPA) are starting to materialize with this simultaneous two-color imaging capability. The Kinetic Kill Vehicle Hardware-in-the-loop Simulator (KHILS) team of the Air Force Research Laboratory and the Guided Weapons Evaluation Facility (GWEF), both at Eglin AFB, FL, have spent the last 10 years developing the ability to project dynamic IR scenes to imaging IR seekers. Through the Wideband Infrared Scene Projector (WISP) program, the capability to project two simultaneous IR scenes to a dual color seeker has been established at KHILS. WISP utilizes resistor arrays to produce the IR energy. Resistor arrays are not ideal blackbodies. The projection of two IR colors with resistor arrays, therefore, requires two optically coupled arrays. This paper documents the first demonstration of two-color simultaneous projection at KHILS. Agema cameras were used for the measurements. The Agema's HgCdTe detector has responsivity from 4 to 14 microns. A blackbody and two IR filters (MWIR equals 4.2 t 7.4 microns, LWIR equals 7.7 to 13 microns) were used to calibrate the Agema in two bands. Each filter was placed in front of the blackbody one at a time, and the temperature of the blackbody was stepped up in incremental amounts. The output counts from the Agema were recorded at each temperature. This calibration process established the radiance to Agema output count curves for the two bands. The WISP optical system utilizes a dichroic beam combiner to optically couple the two resistor arrays. The transmission path of the beam combiner provided the LWIR (6.75 to 12 microns), while the reflective path produced the MWIR (3 to 6.5 microns). Each resistor array was individually projected into the Agema through the beam combiner at incremental output levels. Once again the Agema's output counts were recorded at each resistor array output level. These projections established the resistor array output to Agema count curves for the MWIR and LWIR resistor arrays. Using the radiance to Agema counts curves, the MWIR and LWIR resistor array output to radiance curves were established. With the calibration curves established, a two-color movie was projected and compared to the generated movie radiance values. By taking care to correctly account for the spectral qualities of the Agema camera, the calibration filters, and the diachroic beam combiner, the projections matched the theoretical calculations. In the near future, a Lockheed- Martin Multiple Quantum Well camera with true two-color IR capability will be tested.

Proceedings Article | 15 July 1997 Paper

Simplified method for the hardware implementation of nonuniformity correction on a resistor-array infrared scene projector

Lawrence Jones, Eric Olson, Robert Lee Murrer, Allen Andrews

Proceedings Volume 3084, (1997) https://doi.org/10.1117/12.280944

KEYWORDS: Resistors, Nonuniformity corrections, Sensors, Projection systems, Field effect transistors, Data storage, Staring arrays, Imaging infrared seeker, Infrared radiation, Infrared imaging

Read Abstract +

Proceedings Article | 15 July 1997 Paper

Recent progress in large dynamic resistor arrays

Barry Cole, Robert Higashi, Jeff Ridley, J. Holmen, Earl Benser, Robert Stockbridge, Robert Lee Murrer, Lawrence Jones, Eddie Burroughs

Proceedings Volume 3084, (1997) https://doi.org/10.1117/12.280971

KEYWORDS: Resistors, Metals, Cryogenics, Field effect transistors, Resistance, Electronics, Semiconducting wafers, Projection systems, Infrared imaging, Silicon

Read Abstract +

Proceedings Article | 15 July 1997 Paper

Timing considerations for integrating a flickerless projector with an imaging sensor

David Flynn, Breck Sieglinger, Robert Lee Murrer, Lawrence Jones, Eric Olson, Allen Andrews, James Gordon

Proceedings Volume 3084, (1997) https://doi.org/10.1117/12.280943

KEYWORDS: Cameras, Projection systems, Device simulation, Resistors, Missiles, Infrared radiation, Imaging systems, Optical sensors, Sensors, Solids

Read Abstract +

Proceedings Article | 24 May 1996 Paper

Twenty years of hardware-in-the-loop simulation at Eglin Air Force Base, Florida: lessons learned

Marion Skalka, William Gash, Robert Lee Murrer, Richard Woodard

Proceedings Volume 2741, (1996) https://doi.org/10.1117/12.241114

KEYWORDS: Weapons, Computer simulations, Computing systems, Projection systems, Infrared imaging, Missiles, Antennas, Systems modeling, Climatology, Nondestructive evaluation

Read Abstract +

Proceedings Article | 24 May 1996 Paper

Investigation of the optical sampling between the infrared resistor array projector and the unit under test for hardware-in-the-loop testing

Lawrence Jones, Eric Olson, Robert Lee Murrer

Proceedings Volume 2741, (1996) https://doi.org/10.1117/12.241132

KEYWORDS: Resistors, Cameras, Point spread functions, Projection systems, Image registration, Staring arrays, Field effect transistors, Calibration, Control systems, Infrared radiation

Read Abstract +

Showing 5 of 16 publications

SPIE Conference Volume | 4 June 2013

Technologies for Synthetic Environments: Hardware-in-the-Loop XVIII

SPIE Conference Volume | 6 June 2012

Technologies for Synthetic Environments: Hardware-in-the-Loop XVII

SPIE Conference Volume | 6 May 2011

Technologies for Synthetic Environments: Hardware-in-the-Loop XVI

SPIE Conference Volume | 23 April 2010

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV

SPIE Conference Volume | 23 April 2009

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV

Showing 5 of 18 publications

Conference Committee Involvement (20)

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI

21 April 2015 | Baltimore, MD, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV

6 May 2014 | Baltimore, MD, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop XVIII

2 May 2013 | Baltimore, Maryland, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop XVII

25 April 2012 | Baltimore, Maryland, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop XVI

27 April 2011 | Orlando, Florida, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV

7 April 2010 | Orlando, Florida, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV

13 April 2009 | Orlando, Florida, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII

17 March 2008 | Orlando, Florida, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII

10 April 2007 | Orlando, Florida, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI

18 April 2006 | Orlando (Kissimmee), Florida, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X

29 March 2005 | Orlando, Florida, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX

13 April 2004 | Orlando, Florida, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII

21 April 2003 | Orlando, Florida, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VII

1 April 2002 | Orlando, FL, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI

16 April 2001 | Orlando, FL, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V

24 April 2000 | Orlando, FL, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV

5 April 1999 | Orlando, FL, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III

13 April 1998 | Orlando, FL, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II

21 April 1997 | Orlando, FL, United States

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing

9 April 1996 | Orlando, FL, United States

Showing 5 of 20 Conference Committees

Keywords/Phrases

Search In:

Publication Years