Dr. Barry E. Cole Profile

Dr. Barry E. Cole

Sr Research Scientist at Honeywell Solid State Electronics Ctr

SPIE Involvement:

Author

Publications (14)

Proceedings Article | 17 May 2016 Paper

Applications of multi-spectral imaging: failsafe industrial flame detector

Kwong Wing Au, Christopher Larsen, Barry Cole, Sharath Venkatesha

Proceedings Volume 9836, 983605 (2016) https://doi.org/10.1117/12.2224295

KEYWORDS: Cameras, Flame detectors, Microbolometers, Mid-IR, Long wavelength infrared, Optical filters, Sensors, Bolometers, Bioalcohols, Image filtering

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Proceedings Article | 29 December 2004 Paper

Honeywell’s organic air vehicle chemical-biological sensing platform

Barry Cole, Brian Krafthefer, Daniel Knee, Vaughn Fulton, Kristen Law

Proceedings Volume 5617, (2004) https://doi.org/10.1117/12.569625

KEYWORDS: Sensors, Micro unmanned aerial vehicles, Fluctuations and noise, Unmanned aerial vehicles, Cameras, Biological and chemical sensing, Fourier transforms, Vehicle sensing, Remote sensing

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Proceedings Article | 10 October 2001 Paper

Integrated vacuum packaging for low-cost lightweight uncooled microbolometer arrays

Barry Cole, Robert Higashi, Jeff Ridley, R. Andrew Wood

Proceedings Volume 4369, (2001) https://doi.org/10.1117/12.445291

KEYWORDS: Silicon, Semiconducting wafers, Wafer bonding, Microbolometers, Staring arrays, Packaging, Bolometers, Antireflective coatings, Gas sensors, Resistance

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Proceedings Article | 31 August 2001 Paper

High-speed large-area pixels compatible with 200-Hz frame rates

Barry Cole, Robert Higashi, Jeff Ridley, K. Newstrom, C. Zins, J. Holmen, Thomas Nohava

Proceedings Volume 4366, (2001) https://doi.org/10.1117/12.438064

KEYWORDS: Raster graphics, Electronics, Mid-IR, Cryogenics, Infrared radiation, Projection systems, Semiconducting wafers, Analog electronics, Standards development, Temperature metrology

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Proceedings Article | 12 July 2000 Paper

Innovations in IR projector arrays

Barry Cole, B. Higashi, Jeff Ridley, J. Holmen, K. Newstrom, C. Zins, K. Nguyen, Steven Weeres, Burgess Johnson, Robert Stockbridge, Robert Lee Murrer, Eric Olson, Thomas Bergin, James Kircher, David Flynn

Proceedings Volume 4027, (2000) https://doi.org/10.1117/12.391704

KEYWORDS: Raster graphics, Cameras, Semiconducting wafers, Projection systems, Mid-IR, Electronics, Capacitors, Annealing, Field effect transistors, Infrared cameras

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Proceedings Article | 19 July 1999 Paper

Honeywell resistor array development and future directions

Barry Cole, Steven Weeres, Robert Higashi, Jeff Ridley, J. Holmen, Burgess Johnson

Proceedings Volume 3697, (1999) https://doi.org/10.1117/12.352898

KEYWORDS: Projection systems, Resistors, Electronics, Analog electronics, Raster graphics, Long wavelength infrared, Cryogenics, Silicon, Copper, Metals

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Proceedings Article | 13 July 1998 Paper

Large-area infrared microemitter arrays for dynamic scene projection

Barry Cole, Robert Higashi, Jeff Ridley, J. Holmen, Robert Stockbridge, Robert Lee Murrer, Eddie Burroughs

Proceedings Volume 3368, (1998) https://doi.org/10.1117/12.316356

KEYWORDS: Temperature metrology, Resistance, Field effect transistors, Resistors, Projection systems, Semiconducting wafers, Cryogenics, Electronics, Annealing, Infrared radiation

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Proceedings Article | 15 July 1997 Paper

Recent progress in large dynamic resistor arrays

Barry Cole, Robert Higashi, Jeff Ridley, J. Holmen, Earl Benser, Robert Stockbridge, Robert Lee Murrer, Lawrence Jones, Eddie Burroughs

Proceedings Volume 3084, (1997) https://doi.org/10.1117/12.280971

KEYWORDS: Resistors, Metals, Cryogenics, Field effect transistors, Resistance, Electronics, Semiconducting wafers, Projection systems, Infrared imaging, Silicon

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Proceedings Article | 24 May 1996 Paper

512x512 WISP (wideband infrared scene projector) arrays

Barry Cole, Robert Higashi, Jeff Ridley, J. Holmen, James Arendt, Charles Malone, Robert Stockbridge, George Goldsmith, Lawrence Jones

Proceedings Volume 2741, (1996) https://doi.org/10.1117/12.241131

KEYWORDS: Projection systems, Black bodies, Infrared radiation, Electronics, Resistors, Temperature metrology, Analog electronics, Resistance, Lead, Copper

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Proceedings Article | 2 June 1995 Paper

512x512 cryovacuum resistor infrared scene projector

Chien-Jih Han, Barry Cole, Robert Higashi, Jeff Ridley, J. Holmen, Blair Sawyer, Dennis Wagner, Robert Stockbridge

Proceedings Volume 2469, (1995) https://doi.org/10.1117/12.210586

KEYWORDS: Silicon, Electronics, Resistors, Temperature metrology, Transistors, Projection systems, Cryogenics, Cameras, Semiconducting wafers, Black bodies

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Proceedings Article | 15 June 1994 Paper

High-performance 512 x 512 scene projector for targets against space backgrounds

Barry Cole, Chien-Jih Han, Robert Higashi, Donald Pritchett, B. Sawyer, Thomas Old, George Goldsmith, David Edwards, Robert Stockbridge, Lawrence Jones

Proceedings Volume 2223, (1994) https://doi.org/10.1117/12.177936

KEYWORDS: Projection systems, Thermography, Infrared radiation, Defense and security, Displays, Silicon, Electronics, Black bodies

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Proceedings Article | 13 August 1993 Paper

Ultra-low-power scene projector for targets against space backgrounds

Barry Cole, Chien-Jih Han, Robert Higashi, Thomas Werner, B. Sawyer, Burt Ludington, Roy Hendrick, Thomas Old

Proceedings Volume 1967, (1993) https://doi.org/10.1117/12.151059

KEYWORDS: Electronics, Resistors, Microlens, Temperature metrology, Projection systems, Resistance, Field effect transistors, Long wavelength infrared, Microlens array, Analog electronics

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SPIE Journal Paper | 1 November 1991

Thermal scene projectors using microemitters

Donald Stauffer, Barry Cole

OE, Vol. 30, Issue 11, (November 1991) https://doi.org/10.1117/12.10.1117/12.55991

KEYWORDS: Projection systems, Silicon, Sensors, Thermography, Infrared imaging, Image resolution, Imaging systems, Infrared radiation, Micromachining, Infrared sensors

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Proceedings Article | 1 March 1991 Paper

High-Tc superconducting infrared bolometric detector

Barry Cole

Proceedings Volume 1394, (1991) https://doi.org/10.1117/12.25739

KEYWORDS: Sensors, Superconductors, Bolometers, Resistance, Silicon, Transistors, Resistors, Microbolometers, Metals, Infrared sensors

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Showing 5 of 14 publications

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