Paper
5 November 2001 Establishing calibration tolerances for a scanning seeker optical bench by correlating influence function and Code V analysis methods
Brian J. Perona, Christopher L. Yarbrough
Author Affiliations +
Abstract
For production line manufacturing of Scanning Seekers, the optical train set-up, assembly, alignment and buy-off of optical parameters requires utilization of an automated Optical Test Bench by trained operators. Adjustment of the optical elements to obtain the specified seeker parameters, such as scan-diameter and focus, can be a time consuming iterative process if test errors and techniques of the test bench are not within sufficient accuracy limits of the end product specification. The periodic calibration of the opto- mechanical components is essential to ensure that all aspects of the test system are traceable to standards and the equipment itself has not become inflicted with random measurements errors. This paper covers the development of calibration limits and adjustment tolerances for an optical test bench using the methods of Influence Functions, analysis Code V2 and addressing the limitations of optical bench components.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brian J. Perona and Christopher L. Yarbrough "Establishing calibration tolerances for a scanning seeker optical bench by correlating influence function and Code V analysis methods", Proc. SPIE 4444, Optomechanical Design and Engineering 2001, (5 November 2001); https://doi.org/10.1117/12.447314
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KEYWORDS
Sensors

Calibration

Mirrors

Optical benches

Tolerancing

Single crystal X-ray diffraction

Signal detection

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