Noncontact microwave material characterization

David Glay; Tuami Lasri; Ahmed Mamouni; Yves Leroy

doi:10.1117/12.450171

27 November 2001 Noncontact microwave material characterization

David Glay, Tuami Lasri, Ahmed Mamouni, Yves Leroy

Proceedings Volume 4491, Subsurface and Surface Sensing Technologies and Applications III; (2001) https://doi.org/10.1117/12.450171
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

In this paper, a nondestructive method for the non-contact characterization of non-planar dielectric objects is presented. Traditionally, this kind of measurements is achieved by using spot-focused antennas associated to a vector automatic network analyzer. In this study, we propose a free space measurement system, fitted out with a classical horn antenna, which demonstrates its usefulness in many practical cases. The permittivity is computed from the reflection coefficient of metal-backed samples of different shapes at 2.45 GHz.

Citation Download Citation

David Glay, Tuami Lasri, Ahmed Mamouni, and Yves Leroy "Noncontact microwave material characterization", Proc. SPIE 4491, Subsurface and Surface Sensing Technologies and Applications III, (27 November 2001); https://doi.org/10.1117/12.450171

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