New histogram-based BIST scheme for on-board ADC

Yunan Hu; Liang Wu

doi:10.1117/12.522325

2 September 2003 New histogram-based BIST scheme for on-board ADC

Yunan Hu, Liang Wu

Proceedings Volume 5253, Fifth International Symposium on Instrumentation and Control Technology; (2003) https://doi.org/10.1117/12.522325
Event: Fifth International Symposium on Instrumentation and Control Technology, 2003, Beijing, China

Abstract

A Histogram-based On-Board ADC BIST method is presented in this paper. Compared with the classical Histogram test, this scheme reduces the BIST hardware cost greatly, because the difficulty of nonlinearity computation is reduced in our scheme. Instead, we set a threshold to justify the nonlinearity of the ADC under test.

Citation Download Citation

Yunan Hu and Liang Wu "New histogram-based BIST scheme for on-board ADC", Proc. SPIE 5253, Fifth International Symposium on Instrumentation and Control Technology, (2 September 2003); https://doi.org/10.1117/12.522325

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