Advanced man-portable test systems for characterization of UUTs with laser range finder/designator capabilities

Paul Bryant; Brian Rich; Jack Grigor; Jim McKechnie; Jay James; Steve McHugh; Rich Raney

doi:10.1117/12.604000

12 May 2005 Advanced man-portable test systems for characterization of UUTs with laser range finder/designator capabilities

Paul Bryant, Brian Rich, Jack Grigor, Jim McKechnie, Jay James, Steve McHugh, Rich Raney

Author Affiliations +

Proceedings Volume 5784, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI; (2005) https://doi.org/10.1117/12.604000
Event: Defense and Security, 2005, Orlando, Florida, United States

Abstract

This paper presents the latest developments in instrumentation for military laser range-finder/designator (LRF/D) test and evaluation. SBIR has completed development of two new laser test modules designed to support a wide range of laser measurements including range accuracy and receiver sensitivity, pulse energy and temporal characteristics, beam spatial/angular characteristics, and VIS/IR to laser co-boresighting. The new Laser Energy Module (LEM) provides automated, variable attenuation of UUT laser energy, and performs measurement of beam amplitude and temporal characteristics. The new Laser/Boresight Module (LBM) supports range simulation and receiver sensitivity measurement, performs UUT laser beam analysis (divergence, satellite beams, etc), and supports high-accuracy co-boresighting of VIS, IR, and laser UUT subsystems. The LBM includes a three-color, fiber-coupled laser source (1064, 1540, and 1570 nm), a sophisticated fiber-optic module (FOM) for output energy amplitude modulation, a 1-2 μm SWIR camera, and a variety of advanced triggering and range simulation functions.

Citation Download Citation

Paul Bryant, Brian Rich, Jack Grigor, Jim McKechnie, Jay James, Steve McHugh, and Rich Raney "Advanced man-portable test systems for characterization of UUTs with laser range finder/designator capabilities", Proc. SPIE 5784, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI, (12 May 2005); https://doi.org/10.1117/12.604000

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