Dr. Jay B. James
V.P. of Business Development at Teledyne FLIR
SPIE Involvement:
Author
Publications (14)

Proceedings Article | 30 April 2007 Paper
Jim Oleson, Jay James, Joe LaVeigne, Kevin Sparkman, Greg Matis, Steve McHugh, John Lannon, Scott Goodwin, Alan Huffman, Steve Solomon
Proceedings Volume 6544, 654404 (2007) https://doi.org/10.1117/12.720550
KEYWORDS: Convolution, Projection systems, Image processing, Infrared imaging, Video, Signal processing, Infrared radiation, Human-machine interfaces, Control systems, Nonuniformity corrections

Proceedings Article | 30 April 2007 Paper
Proceedings Volume 6544, 654402 (2007) https://doi.org/10.1117/12.717871
KEYWORDS: Calibration, FT-IR spectroscopy, Infrared radiation, Black bodies, Temperature metrology, Photons, Resistors, Dielectrics, Spectroscopy, Data modeling

Proceedings Article | 30 April 2007 Paper
Proceedings Volume 6544, 654405 (2007) https://doi.org/10.1117/12.720610
KEYWORDS: Cryogenics, Analog electronics, Electronics, Prototyping, Packaging, Interfaces, Mid-IR, Digital electronics, Microelectromechanical systems, Temperature metrology

Proceedings Article | 16 May 2006 Paper
Proceedings Volume 6208, 620812 (2006) https://doi.org/10.1117/12.669302
KEYWORDS: Cryogenics, Electronics, Interfaces, Resistance, Control systems, Semiconducting wafers, Tungsten, Prototyping, Heatsinks, Infrared radiation

Proceedings Article | 16 May 2006 Paper
Jim Oleson, Jay James, Joe LaVeigne, Kevin Sparkman, Greg Matis, Steve McHugh, John Lannon, Scott Goodwin, Alan Huffman, Steve Solomon, Paul Bryant
Proceedings Volume 6208, 620810 (2006) https://doi.org/10.1117/12.669301
KEYWORDS: Projection systems, Infrared radiation, Control systems, Image processing, Infrared imaging, Video, Human-machine interfaces, Temperature metrology, Electronics, Nonuniformity corrections

Showing 5 of 14 publications
Conference Committee Involvement (2)
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII
17 March 2008 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
10 April 2007 | Orlando, Florida, United States
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