Highly accurate calibration of optical radiation at infrared spectrum using thermopile TS-76

Lei Zhang; Xiao-bing Zheng; Ji Wang; Ping Xie; Feng Chen; Shuang Li; Wei Zhang

doi:10.1117/12.676519

23 February 2006 Highly accurate calibration of optical radiation at infrared spectrum using thermopile TS-76

Lei Zhang, Xiao-bing Zheng, Ji Wang, Ping Xie, Feng Chen, Shuang Li, Wei Zhang

Proceedings Volume 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 615041 (2006) https://doi.org/10.1117/12.676519
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

Infrared radiometric calibration is of critical importance for information quantification of satellite remote sensing of environment at infrared spectrum. In this paper, thin-film thermopile sensors (IPHT-Jena, type TS-76) are used as transfer detectors in the spectral range from 514nm to 1550nm. The relative uncertainty in the spectral responsivity of the thin-film thermopiles was about 1.5%. Further work will be focused on calibrating TS-76 with a monochromator to extend the spectral range from 1800nm to 3000nm and reducing uncertainty budget of TS-76.

Citation Download Citation

Lei Zhang, Xiao-bing Zheng, Ji Wang, Ping Xie, Feng Chen, Shuang Li, and Wei Zhang "Highly accurate calibration of optical radiation at infrared spectrum using thermopile TS-76", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615041 (23 February 2006); https://doi.org/10.1117/12.676519

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KEYWORDS

Calibration

Sensors

Infrared radiation

Infrared sensors

Thermography

Bolometers

Radiometry

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