Paper
10 June 2006 Simulation of RTD with the use of one- and two-band combined models
I. I. Abramov, I. A. Goncharenko, N. V. Kolomejtseva
Author Affiliations +
Proceedings Volume 6260, Micro- and Nanoelectronics 2005; 62601S (2006) https://doi.org/10.1117/12.683557
Event: Micro- and Nanoelectronics 2005, 2005, Zvenigorod, Russian Federation
Abstract
The results of physical process simulations for different structures of resonant-tunneling diode (RTD) are described in the paper. One-band [1,2] and two-band combined numerical models of RTD are involved in investigation. Two coupled Schodinger equations are solved in two-band combined model. It allows to consider Γ-X intervalley scattering influence on electron transport in RTD. The developed one- and two-band models permits to take into account of charge influence in different regions of device, including surface charge, classical and quantum-mechanical regions interaction, shape of energy-band offset on heterojunctions, other scattering mechanisms, resistances of near-contact regions. The models allow to simulate RTD with arbitrary number of barriers and calculate have functions, charge and potential distributions, transmission and IV- characteristics depending on different material parameters and structure design. The proposed models have been included in numerical simulation subsystem NS-RTS-NANODEV, which is a part of nanoelectronic device system NANODEV. In the paper the comparison of simulation results carried out with the use of proposed one- and two-band combined models of RTD are presented. It allows to verify significance of Γ-X intervalley scattering for some material systems in a number of cases.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. I. Abramov, I. A. Goncharenko, and N. V. Kolomejtseva "Simulation of RTD with the use of one- and two-band combined models", Proc. SPIE 6260, Micro- and Nanoelectronics 2005, 62601S (10 June 2006); https://doi.org/10.1117/12.683557
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KEYWORDS
Scattering

Instrument modeling

Gallium arsenide

Systems modeling

Diodes

Heterojunctions

Nanoelectronics

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