Optical system for investigations of low-cost diffraction gratings

Przemyslaw Czapski; Lukasz Platos; Michal Jozwik

doi:10.1117/12.734325

10 September 2007 Optical system for investigations of low-cost diffraction gratings

Przemyslaw Czapski, Lukasz Platos, Michal Jozwik

Proceedings Volume 6672, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III; 667206 (2007) https://doi.org/10.1117/12.734325
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

Current development of replication technologies in plastics offers a variety of low-cost diffraction structures. Diffraction grating functionality depends on the designed technical parameters and fabrication procedures. For these reasons a specific knowledge about modeling, fabrication and achieved technical parameters of diffraction gratings are important and need to be tested. In the paper we propose an optical system for determination of global (angles of diffraction, diffraction efficiency) and local (diffracted wavefront quality (PV, RMS)) parameters of linear diffraction gratings. The system combines the capabilities of precise determination of intensity distribution in all existing orders of transmission and reflection type diffraction gratings with full-field measurement (based on grating shearing interferometry) of waverfronts generated by linear gratings. The functionality of the proposed system architecture was proven through exemplary measurements of gratings replicated in PMMA by hot embossing technology.

Citation Download Citation

Przemyslaw Czapski, Lukasz Platos, and Michal Jozwik "Optical system for investigations of low-cost diffraction gratings", Proc. SPIE 6672, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III, 667206 (10 September 2007); https://doi.org/10.1117/12.734325

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