Defect reduction through Lean methodology

Kathleen Purdy; Louis Kindt; Jim Densmore; Craig Benson; Nancy Zhou; John Leonard; Cynthia Whiteside; Robert Nolan; David Shanks

doi:10.1117/12.864524

24 September 2010 Defect reduction through Lean methodology

Kathleen Purdy, Louis Kindt, Jim Densmore, Craig Benson, Nancy Zhou, John Leonard, Cynthia Whiteside, Robert Nolan, David Shanks

Author Affiliations +

Proceedings Volume 7823, Photomask Technology 2010; 78231Y (2010) https://doi.org/10.1117/12.864524
Event: SPIE Photomask Technology, 2010, Monterey, California, United States

Abstract

Lean manufacturing is a systematic method of identifying and eliminating waste. Use of Lean manufacturing techniques at the IBM photomask manufacturing facility has increased efficiency and productivity of the photomask process. Tools, such as, value stream mapping, 5S and structured problem solving are widely used today. In this paper we describe a step-by-step Lean technique used to systematically decrease defects resulting in reduced material costs, inspection costs and cycle time. The method used consists of an 8-step approach commonly referred to as the 8D problem solving process. This process allowed us to identify both prominent issues as well as more subtle problems requiring in depth investigation. The methodology used is flexible and can be applied to numerous situations. Advantages to Lean methodology are also discussed.

Citation Download Citation

Kathleen Purdy, Louis Kindt, Jim Densmore, Craig Benson, Nancy Zhou, John Leonard, Cynthia Whiteside, Robert Nolan, and David Shanks "Defect reduction through Lean methodology", Proc. SPIE 7823, Photomask Technology 2010, 78231Y (24 September 2010); https://doi.org/10.1117/12.864524

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