Open Access
29 June 2012 Errata: Stochastic modeling in lithography: autocorrelation behavior of catalytic reaction-diffusion systems
Author Affiliations +
Abstract
Abstract unavailable.
© 2012 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2012/$25.00 © 2012 SPIE
Chris A. Mack "Errata: Stochastic modeling in lithography: autocorrelation behavior of catalytic reaction-diffusion systems," Journal of Micro/Nanolithography, MEMS, and MOEMS 11(2), 029801 (29 June 2012). https://doi.org/10.1117/1.JMM.11.2.029801
Published: 29 June 2012
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Lithography

Stochastic processes

Systems modeling

3D modeling

Diffusion

Point spread functions

Convolution

Back to Top