Dr. Ahmed Ziani
Postdoc CNES - optique XUV at Institut d'Optique Graduate School
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 October 2011 Paper
A. Ziani, F. Delmotte, C. Le Paven-Thivet, E. Meltchakov, F. Bridou, A. Jérome, M. Roulliay, K. Gasc
Proceedings Volume 8168, 81681S (2011) https://doi.org/10.1117/12.896433
KEYWORDS: Reflectivity, Aluminum, Ion beams, Mirrors, Sputter deposition, Multilayers, Extreme ultraviolet, Reflectometry, Ultraviolet radiation, X-rays

Proceedings Article | 4 October 2011 Paper
E. Meltchakov, A. Ziani, F. Auchere, X. Zhang, M. Roulliay, S. De Rossi, Ch. Bourassin-Bouchet, A. Jérome, F. Bridou, F. Varniere, F. Delmotte
Proceedings Volume 8168, 816819 (2011) https://doi.org/10.1117/12.896577
KEYWORDS: Multilayers, Reflectivity, Extreme ultraviolet, Aluminum, Silicon carbide, Silicon, X-rays, Interfaces, Synchrotron radiation, Temperature metrology

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