Antje Kaless
Product Assurance at RUAG Space AG
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 20 October 2005 Paper
Proceedings Volume 5965, 59651N (2005) https://doi.org/10.1117/12.623547
KEYWORDS: Polymethylmethacrylate, Plasma treatment, Ions, Etching, Plasma, Antireflective coatings, Polymers, Nanostructures, Scanning electron microscopy, Absorbance

Proceedings Article | 20 October 2005 Paper
Proceedings Volume 5965, 59651O (2005) https://doi.org/10.1117/12.624363
KEYWORDS: Reflection, Refractive index, Metals, Polymethylmethacrylate, Coating, Plasma treatment, Etching, Absorption, Plasma, Stochastic processes

Proceedings Article | 24 August 2005 Paper
Proceedings Volume 5872, 587201 (2005) https://doi.org/10.1117/12.613246
KEYWORDS: Antireflective coatings, Polymers, Optical coatings, Polymethylmethacrylate, Ions, Refractive index, Plasma, Reflection, Etching, Reflectivity

Proceedings Article | 25 February 2004 Paper
Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.512694
KEYWORDS: Coating, Thin films, Light scattering, Scattering, Nanostructures, Atomic force microscopy, Solids, Water, Optical interferometry, Scanning tunneling microscopy

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