Mr. Chris Hsieh Profile

Chris Hsieh

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 10 April 2024 Poster + Paper

NZO reduction via small pitch imaging-based overlay targets

Cheng-Ta Cheng, Hong Ching, Foster Huang, Zephyr Liu, Dor Yehuda, Michael Har-Zvi, Chris Hsieh, Penny Lin, York Yang

Proceedings Volume 12955, 1295530 (2024) https://doi.org/10.1117/12.3010703

KEYWORDS: Metrology, Overlay metrology, Inspection, Design, Optical parametric oscillators, Design rules, Semiconducting wafers, Scanners, Etching, Diffractive optical elements

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years