Prof. Christian Schüller
at Univ Regensburg
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 20 September 2018 Paper
S. Gelfert, C. Frankerl, C. Reichl, D. Schuh, G. Salis, W. Wegscheider, D. Bougeard, T. Korn, C. Schüller
Proceedings Volume 10732, 1073219 (2018) https://doi.org/10.1117/12.2320205
KEYWORDS: Quantum wells, Crystals, Magnetism, Spectroscopy, Raman spectroscopy, Light scattering, Backscatter, Transistors, Raman scattering, Scattering

Proceedings Article | 22 February 2018 Paper
Philipp Nagler, Fabian Mooshammer, Mariana Ballotin, Anatolie Mitioglu, Gerd Plechinger, Sebastian Meier, Nicola Paradiso, Christoph Strunk, Rupert Huber, Alexey Chernikov, Peter C. Christianen, Christian Schüller, Tobias Korn
Proceedings Volume 10530, 1053015 (2018) https://doi.org/10.1117/12.2286276
KEYWORDS: Excitons, Magnetism, Heterojunctions, Second-harmonic generation, Crystals, Polarization, Luminescence, Temperature metrology, Microscopes, Optical spectroscopy

Proceedings Article | 23 February 2017 Presentation + Paper
Malte Selig, Gunnar Berghäuser, Archana Raja, Philipp Nagler, Christian Schüller, Tony Heinz, Tobias Korn, Alexey Chernikov, Ermin Malic, Andreas Knorr
Proceedings Volume 10102, 101021F (2017) https://doi.org/10.1117/12.2252486
KEYWORDS: Excitons, Phonons, Transition metals, Quantum optics, Ultrafast phenomena, Semiconductors, Particles, Quantum mechanics, Quantum electronics, Optoelectronics, Polarization, Scattering, Virtual colonoscopy, Molybdenum, Acoustics, Absorption

Proceedings Article | 8 September 2015 Presentation + Paper
Gerd Plechinger, Philipp Nagler, Christian Schüller, Tobias Korn
Proceedings Volume 9551, 95510V (2015) https://doi.org/10.1117/12.2186402
KEYWORDS: Excitons, Polarization, Temperature metrology, Raman spectroscopy, Picosecond phenomena, Scattering, Time resolved spectroscopy, Transition metals, Crystals, Laser beam diagnostics

Proceedings Article | 15 October 2012 Paper
G. Plechinger, S. Heydrich, M. Hirmer, F.-X. Schrettenbrunner, D. Weiss, J. Eroms, C. Schüller, T. Korn
Proceedings Volume 8463, 84630N (2012) https://doi.org/10.1117/12.928068
KEYWORDS: Raman spectroscopy, Silicon, Crystals, Phonons, Atomic force microscopy, Semiconductors, Polarization, Light scattering, Graphene, Optical microscopes

Showing 5 of 10 publications
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