CONFERENCE PROCEEDINGS
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Christine Fréal
at LYNRED
SPIE Involvement:
Author
Publications (2)
Proceedings Article | 13 June 2023 Presentation + Paper
Status of 8.5μm pitch bolometer developments at Lynred
Sébastien Cortial, Christophe Pautet, Bastien Bruneau, Patrick Robert, Marc Guillaumont, Ewen Henaff, Alexandra Madalina Siladie, Karine Rousseau, Joan Magnin Oddos, Frederic Bouvard, Christine Freal, Marion Guibert, Maxime Boistard, Delphine Brellier, Laurent Carle, Geoffroy Dumont, Gaëlle Eleouet, Valérie Goudon, Mélanie Le Cocq, Patrick Leduc, Denis Pelenc, Thomas Perrillat-Bottonet, Olivier Peyssonneaux, Stéphane Pocas, Claire Vialle, Jean-Jacques Yon
Proceedings Volume 12534, 125341A (2023) https://doi.org/10.1117/12.2663455
KEYWORDS: Design and modelling, Bolometers, Readout integrated circuits, Signal to noise ratio, Resistance, Absorption, Microbolometers, Sensors
Proceedings Article | 27 May 2022 Presentation + Paper
Recent thermoresistive material evolutions at LYNRED for improving uncooled microbolometer products thermal sensitivity
Marc Guillaumont, Stéphane Altazin, Alexi Cardoso, Sébastien Tinnes, Claire Pistre, Alain Durand, Aurélien Dariel, Fabio Rossini, Clémence Laurent, Christine Fréal, Gérard Mandran, Christian Bellon, Sébastien Cortial, Matthieu Cueff, Christophe Pautet, Nicolas Boudou, Sarah Gays, Xavier Zucchi, Denis Pelenc, Jean-Jacques Yon, Wilfried Rabaud, Valérie Goudon, Claire Vialle, Stéphane Pocas, Delphine Brellier, Rachid Hida, Tony Jullien, Zouhir Mehrez, Elisa Vermande, Antoine Schembri, Pierre Brianceau
Proceedings Volume 12107, 1210716 (2022) https://doi.org/10.1117/12.2618494
KEYWORDS: Staring arrays, Microbolometers, Amorphous silicon, Sensors, Manufacturing, Signal to noise ratio, Amorphous semiconductors
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