Ms. Delphine Brellier Profile

Delphine Brellier

at CEA-LETI

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 13 June 2023 Presentation + Paper

Status of 8.5μm pitch bolometer developments at Lynred

Sébastien Cortial, Christophe Pautet, Bastien Bruneau, Patrick Robert, Marc Guillaumont, Ewen Henaff, Alexandra Madalina Siladie, Karine Rousseau, Joan Magnin Oddos, Frederic Bouvard, Christine Freal, Marion Guibert, Maxime Boistard, Delphine Brellier, Laurent Carle, Geoffroy Dumont, Gaëlle Eleouet, Valérie Goudon, Mélanie Le Cocq, Patrick Leduc, Denis Pelenc, Thomas Perrillat-Bottonet, Olivier Peyssonneaux, Stéphane Pocas, Claire Vialle, Jean-Jacques Yon

Proceedings Volume 12534, 125341A (2023) https://doi.org/10.1117/12.2663455

KEYWORDS: Design and modelling, Bolometers, Readout integrated circuits, Signal to noise ratio, Resistance, Absorption, Microbolometers, Sensors

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Proceedings Article | 27 May 2022 Presentation + Paper

Recent thermoresistive material evolutions at LYNRED for improving uncooled microbolometer products thermal sensitivity

Marc Guillaumont, Stéphane Altazin, Alexi Cardoso, Sébastien Tinnes, Claire Pistre, Alain Durand, Aurélien Dariel, Fabio Rossini, Clémence Laurent, Christine Fréal, Gérard Mandran, Christian Bellon, Sébastien Cortial, Matthieu Cueff, Christophe Pautet, Nicolas Boudou, Sarah Gays, Xavier Zucchi, Denis Pelenc, Jean-Jacques Yon, Wilfried Rabaud, Valérie Goudon, Claire Vialle, Stéphane Pocas, Delphine Brellier, Rachid Hida, Tony Jullien, Zouhir Mehrez, Elisa Vermande, Antoine Schembri, Pierre Brianceau

Proceedings Volume 12107, 1210716 (2022) https://doi.org/10.1117/12.2618494

KEYWORDS: Staring arrays, Microbolometers, Amorphous silicon, Sensors, Manufacturing, Signal to noise ratio, Amorphous semiconductors

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Proceedings Article | 14 May 2018 Presentation + Paper

From CdZnTe bulk growth to HgCdTe infra-red detectors: mastering the chain for high-performance and reliable imaging

A. Cathignol, D. Brellier, E. Gout, P. Fougères, M. C. Manzato , C. Roman-Tinnes , A. Brunner, Y. Loreau, S. Giraud, L. Rubaldo, S. Chabanet , A. Kapferer, Y. Reibel , V. Destefanis

Proceedings Volume 10624, 106240W (2018) https://doi.org/10.1117/12.2304950

KEYWORDS: Mercury cadmium telluride, Staring arrays, Image quality, Sensors, Manufacturing, Image processing, Electro optics, Crystals, Zinc

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Proceedings Article | 14 May 2018 Presentation + Paper

Achievement of high image quality MCT sensors with Sofradir vertical industrial model

Laurent Rubaldo, Pierre Guinedor, Alexandre Brunner, Vincent Destefanis, Paul Fougères, Armelle Kapferer, D. Sam-giao, L. Dargent, Alexandre Kerlain, Augustin Cathignol, Valery Compain, François Boulard, Delphine Brellier, Olivier Gravrand

Proceedings Volume 10624, 106240U (2018) https://doi.org/10.1117/12.2307344

KEYWORDS: Image quality, Nonuniformity corrections, Sensors, Medium wave, Staring arrays, Crystals, Mercury cadmium telluride, Liquid phase epitaxy, Image sensors, Indium gallium arsenide

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Proceedings Article | 26 January 2018 Paper

Sofradir vertical industrial model for high-image-quality MCT detectors

Laurent Rubaldo, Pierre Guinedor, Alexandre Brunner, Vincent Destefanis, Paul Fougères, Armelle Kapferer, D. Sam-Giao, L. Dargent, Alexandre Kerlain, Augustin Cathignol, Valery Compain, François Boulard, Delphine Brellier, Olivier Gravrand

Proceedings Volume 10540, 105400I (2018) https://doi.org/10.1117/12.2300392

KEYWORDS: Image quality, Nonuniformity corrections, Sensors, Crystals, Staring arrays, Mercury cadmium telluride, Liquid phase epitaxy, Fluctuations and noise

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Proceedings Article | 24 June 2014 Paper

Latest developments in the p-on-n HgCdTe architecture at DEFIR

P. Castelein, N. Baier, O. Gravrand, L. Mollard, D. Brellier, F. Rochette, A. Kerlain, L. Rubaldo, Y. Reibel, G. Destefanis

Proceedings Volume 9070, 90702Y (2014) https://doi.org/10.1117/12.2054023

KEYWORDS: Sensors, Long wavelength infrared, Photodiodes, Liquid phase epitaxy, Diodes, Diffusion, Doping, Staring arrays, Temperature metrology, Mid-IR

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Proceedings Article | 24 October 2012 Paper

Latest developments of MCT focal plane arrays in France

M. Vuillermet, D. Billon-Lanfrey, Y. Reibel, A. Manissadjian, L. Mollard, N. Baier, O. Gravrand, D. Brellier, G. Destéfanis

Proceedings Volume 8541, 854109 (2012) https://doi.org/10.1117/12.977470

KEYWORDS: Sensors, Staring arrays, Avalanche photodetectors, Diodes, Photodiodes, Infrared detectors, Epitaxy, Temperature metrology, Infrared technology, Manufacturing

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Showing 5 of 7 publications

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