We propose a novel, rigorous but simplified method for modeling multilayer systems with the well-known effective medium approximation (EMA) particularily for the intermixed interface. The EMA defines the intermixed layer as a mixture of surrounding layers with a proper volume fraction of each and with this the inhomogeneous mixing can be effectively treated. The EMA and transfer matrix method for the multilayer system predicts the reflection of the system at any angle in a given wavelength range with a superb quality, enabling simulations with a precise fit of measured spectra, and accurate and physically robust extraction of optical parameters. Moreover, the intermixing can be quantified, thus, can be considered in a more systematic way. Demonstration is given with in-line production data from Samsung Photomask Shop.
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