Dr. Daniel Some
Principal Scientist at Wyatt Technology Corp
SPIE Involvement:
Author
Area of Expertise:
laser scattering experiment and simulations , wafer inspection / defect detection , optical characterization of macromolecules , macromolecular interactions , LabView for lab and end users , laser interactions for imaging and diagnostics
Profile Summary

Applied Research, Commercialization and Advanced Application Development of Electrooptic/Laser Systems & Instrumentation; Creativity and Technical Leadership

My career in R&D has covered many aspects of interdisciplinary electro-optics and laser research, development, and applications: fieldss as varied as protein interactions and semiconductor wafer inspection; components to systems; basic and applied research; experimental and computational studies. Today I am Principal Scientist at Wyatt Technology Corporation, developing technology for laser-based characterization of macromolecular interactions and leading a product development program.

Past professional interests include applications of ultrafast pulsed lasers, laser-based diagnostics and defect detection in patterned semiconductor wafers.
Publications (1)

Proceedings Article | 24 May 2004 Paper
Byoung Ho Lee, Soo-Bok Chin, Do Hyun Cho, Chang-Lyong Song, Jeong-Ho Yeo, Daniel Some, Silviu Reinhorn
Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.534491
KEYWORDS: Signal to noise ratio, Polarization, Semiconducting wafers, Dielectric polarization, Silicon, Light scattering, Scattering, Defect detection, Interference (communication), Oxides

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