Dr. Fan Wu Profile

Dr. Fan Wu

at State Key Lab of Modern Optical Instrumentation

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Publications (8)

Proceedings Article | 3 September 2019 Paper

Detection and discrimination of particles on and below smooth surfaces by laser scattering with polarization measurement

Fan Wu, Yubin Du, Pengfei Zhang, Yanwei Li, Yongying Yang

Proceedings Volume 11102, 111021F (2019) https://doi.org/10.1117/12.2528373

KEYWORDS: Particles, Polarization, Light scattering, Mueller matrices, Laser scattering, Computer simulations, Scatter measurement, Inspection

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Proceedings Article | 7 March 2019 Paper

Defect detection method for complex surface based on human visual characteristics and feature extracting

Yubin Du, Pin Cao, Yongying Yang, Fanyi Wang, Rongzhi Liu, Fan Wu, Pengfei Zhang, Huiting Chai, Jiabin Jiang, Yihui Zhang, Guohua Feng, Xiang Xiao, Yanwei Li

Proceedings Volume 11053, 110531R (2019) https://doi.org/10.1117/12.2511490

KEYWORDS: Machine vision, Image filtering, Defect detection, Image processing algorithms and systems, Image processing, Gaussian filters, Detection and tracking algorithms, Image quality

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Proceedings Article | 7 March 2019 Paper

Complicated intermittent scratches detection research on surface of optical components based on adaptive sector scanning algorithm cascading mean variance threshold algorithm

Fanyi Wang, Pin Cao, Yongying Yang, Rongzhi Liu, Fan Wu, Pengfei Zhang, Jiabin Jiang, Huiting Chai, Yihui Zhang, Yubin Du, Guohua Feng, Xiang Xiao, Yanwei Li

Proceedings Volume 11053, 110531L (2019) https://doi.org/10.1117/12.2511381

KEYWORDS: Detection and tracking algorithms, Optical components, Image processing, Parallel processing, Machine vision, Pattern recognition

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Proceedings Article | 14 September 2018 Paper

Spherical optical surface defects digitizing evaluation system

Yihui Zhang, Fan Wu, Yongying Yang, Jian Bai, Huiting Chai, Yao Li

Proceedings Volume 10742, 107421A (2018) https://doi.org/10.1117/12.2320473

KEYWORDS: Spherical lenses, Optical components, Imaging systems, Microscopes, Inspection, Image processing, Light scattering, Optical testing

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Proceedings Article | 24 July 2018 Paper

Simulation of the illuminating scene designed for curved surface defect optical inspection

Pengfei Zhang, Fan Wu, Yongying Yang, Rongzhi Liu, Fanyi Wang, Yubin Du, Yanwei Li

Proceedings Volume 10827, 1082722 (2018) https://doi.org/10.1117/12.2500572

KEYWORDS: Defect detection, Cameras, Bidirectional reflectance transmission function, Light sources, Optical inspection, Monte Carlo methods, Statistical modeling, Surface properties, Inspection, Modeling

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Proceedings Article | 24 November 2016 Paper

Algorithms and applications of aberration correction and American standard-based digital evaluation in surface defects evaluating system

Fan Wu, Pin Cao, Yongying Yang, Chen Li, Huiting Chai, Yihui Zhang, Haoliang Xiong, Wenlin Xu, Kai Yan, Lin Zhou, Dong Liu, Jian Bai, Yibing Shen

Proceedings Volume 10023, 100230T (2016) https://doi.org/10.1117/12.2245891

KEYWORDS: Distortion, Inspection, Defect inspection, Standards development, Imaging systems, Scattering, Optical components, Image processing, Microscopes, Optical inspection

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Proceedings Article | 24 November 2016 Paper

Numerical simulation research and applications on scattering imaging of surface defects on optical components

Huiting Chai, Pin Cao, Yongying Yang, Chen Li, Fan Wu, Yihui Zhang, Haoliang Xiong, Lin Zhou, Kai Yan, Wenlin Xu, Dong Liu, Jian Bai, Yibing Shen

Proceedings Volume 10023, 100230L (2016) https://doi.org/10.1117/12.2245430

KEYWORDS: Light scattering, Electromagnetic scattering, Scattering, Finite-difference time-domain method, Imaging systems, Diffraction, Inspection, Calibration, Electromagnetism, Electron beam lithography

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Proceedings Article | 27 September 2016 Paper

Research on auto-centering device in surface defects evaluation system of large spherical optics

Yihui Zhang, Yongying Yang, Fan Wu, Huiting Chai, Kai Yan, Lin Zhou, Yang Li, Dong Liu, Jian Bai, Yibing Shen, Pin Cao

Proceedings Volume 9684, 96841N (2016) https://doi.org/10.1117/12.2243299

KEYWORDS: Spherical lenses, Reticles, Charge-coupled devices, Image processing, Microscopy, Imaging systems, Digital image processing, Optical testing, Image segmentation, Optical scanning systems

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Showing 5 of 8 publications

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