Dr. Franz Schaefers Profile

Dr. Franz Schaefers

Scientist at Helmholtz-Zentrum Berlin

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Author

Publications (21)

SPIE Journal Paper | 10 April 2021 Open Access

Optical constants of beryllium thin layers determined from Mo/Be multilayers in spectral range 90 to 134 eV

Mewael Giday Sertsu, Andrey Sokolov, Nikolay Chkhalo, Vladimir Polkovnikov, Nikolay Salashchenko, Mikhail Svechnikov, Franz Schäfers

OE, Vol. 60, Issue 04, 044103, (April 2021) https://doi.org/10.1117/12.10.1117/1.OE.60.4.044103

KEYWORDS: Beryllium, Extreme ultraviolet, Reflectivity, Multilayers, Silicon, Absorption, X-rays, Silicon carbide, Molybdenum, Reflectometry

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Proceedings Article | 7 September 2017 Paper

Investigation of HF-plasma-treated soft x-ray optical elements

F. Eggenstein, M. Krivenkov, I. Rudolph, M. Sertsu, A. Sokolov, A. Varykhalov, J. Wolf, T. Zeschke, F. Schäfers

Proceedings Volume 10385, 1038505 (2017) https://doi.org/10.1117/12.2272967

KEYWORDS: Carbon, Metrology, X-rays, X-ray optics, Optical components, Contamination, Reflectometry, Synchrotron radiation, Scanning tunneling microscopy, Reflectivity

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Proceedings Article | 5 September 2014 Paper

A reflectometer for at-wavelength characterization of XUV-reflection gratings

F. Eggenstein, P. Bischoff, A. Gaupp, F. Senf, A. Sokolov, T. Zeschke, F. Schäfers

Proceedings Volume 9206, 920607 (2014) https://doi.org/10.1117/12.2061828

KEYWORDS: Reflectometry, Mirrors, Sensors, Polarization, Extreme ultraviolet, Monochromators, Metrology, Optical components, LabVIEW, Reflectivity

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Proceedings Article | 5 September 2014 Paper

An XUV optics beamline at BESSY II

A. Sokolov, F. Eggenstein, A. Erko, R. Follath, S. Künstner, M. Mast, J. Schmidt, F. Senf, F. Siewert, T. Zeschke, F. Schäfers

Proceedings Volume 9206, 92060J (2014) https://doi.org/10.1117/12.2061778

KEYWORDS: Mirrors, Reflectometry, Monochromators, Metrology, Sensors, Extreme ultraviolet, Diffraction gratings, Reflectivity, Optical components, Collimation

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Proceedings Article | 15 October 2012 Paper

Initial evaluation of the European XFEL undulator commissioning spectrometer with a single channel-cut crystal

Cigdem Ozkan, Wolfgang Freund, Jens Rehanek, Jens Buck, Ivo Zizak, Jan Gruenert, Franz Schaefers, Alexei Erko, Serguei Molodtsov

Proceedings Volume 8504, 85040X (2012) https://doi.org/10.1117/12.929755

KEYWORDS: Monochromators, Crystals, Free electron lasers, Spectroscopy, X-rays, Laser crystals, Prototyping, X-ray lasers, Diodes, Synchrotrons

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Proceedings Article | 23 September 2011 Paper

Simulations of diagnostic spectrometers for the European XFEL using the ray-trace tool RAY

Jens Rehanek, Franz Schäfers, Alexei Erko, Michael Scheer, Wolfgang Freund, Jan Grünert, Cigdem Ozkan, Serguei Molodtsov

Proceedings Volume 8141, 814109 (2011) https://doi.org/10.1117/12.906038

KEYWORDS: Spectrometers, Zone plates, Crystals, Monochromators, Silicon, Diagnostics, Ray tracing, Free electron lasers, Sensors, X-rays

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Proceedings Article | 14 September 2005 Paper

Carbon window soft x-ray imaging using multilayer optics

Igor Artyukov, Yegor Bugayev, Oleksandr Yu. Devizenko, Ruslan Feschenko, Yuri Kasyanov, Valeri Kondratenko, Svetlana Romanova, Sergei Saveliev, Franz Schäfers, Torsten Feigl, Yuri Uspenski, Alexander Vinogradov

Proceedings Volume 5919, 59190E (2005) https://doi.org/10.1117/12.620037

KEYWORDS: Carbon, X-rays, Mirrors, Reflectivity, Multilayers, X-ray imaging, Cobalt, X-ray optics, Microscopy, X-ray microscopy

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Proceedings Article | 21 October 2004 Paper

A ray-tracing code for zone plates

Alexei Erko, Franz Schaefers, Nikolay Artemiev

Proceedings Volume 5536, (2004) https://doi.org/10.1117/12.563685

KEYWORDS: Zone plates, Diffraction, Ray tracing, Optical components, Crystals, Gold, Diffraction gratings, Mathematical modeling, X-ray optics, Wavefronts

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Proceedings Article | 13 January 2004 Paper

High-performance Cr/Sc multilayers for the soft x-ray range

Sergiy Yulin, Franz Schaefers, Torsten Feigl, Norbert Kaiser

Proceedings Volume 5193, (2004) https://doi.org/10.1117/12.505688

KEYWORDS: Reflectivity, Mirrors, Multilayers, X-rays, Chromium, Absorption, Interfaces, Annealing, Transmission electron microscopy, Optical components

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Proceedings Article | 13 January 2004 Paper

Enhanced reflectivity and stability of Sc/Si multilayers

Sergiy Yulin, Franz Schaefers, Torsten Feigl, Norbert Kaiser

Proceedings Volume 5193, (2004) https://doi.org/10.1117/12.505582

KEYWORDS: Reflectivity, Multilayers, Mirrors, Scandium, Silicon, Chromium, Interfaces, Diffusion, Transmission electron microscopy, X-rays

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Proceedings Article | 4 November 2003 Paper

At-wavelength metrology on Sc-based multilayers for the UV and water window

Franz Schaefers, Sergiy Yulin, Torsten Feigl, Norbert Kaiser

Proceedings Volume 5188, (2003) https://doi.org/10.1117/12.505695

KEYWORDS: Reflectivity, Multilayers, X-rays, Mirrors, Metrology, Ultraviolet radiation, Optical coatings, Scandium, Absorption, Silicon

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Proceedings Article | 16 November 1999 Paper

Optical components for polarization analysis of soft x-ray radiation

Hans Grimmer, Oksana Zaharko, Michael Horisberger, Hans-Christoph Mertins, Franz Schaefers, Urs Staub

Proceedings Volume 3773, (1999) https://doi.org/10.1117/12.370095

KEYWORDS: Reflectivity, Polarization, X-rays, Iron, Magnetism, Absorption, Silicon, Phase shifts, Linear polarizers, Sputter deposition

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Proceedings Article | 25 June 1998 Paper

Short-period x-ray multilayers

S. Andreev, A. Fraerman, Kiril Prokhorov, Nikolai Salashchenko, E. Shamov, S. Zuev, F. Schafers

Proceedings Volume 3406, (1998) https://doi.org/10.1117/12.310984

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Proceedings Article | 3 November 1997 Paper

Laminar versus trapezoidal grating profiles: AFM measurements and efficiency simulations

Gerd Reichardt, Franz Schaefers

Proceedings Volume 3150, (1997) https://doi.org/10.1117/12.279367

KEYWORDS: Diffraction gratings, Diffraction, Atomic force microscopy, Grazing incidence, Energy efficiency, Monochromators, Optical coatings, Computer programming, Microscopes, Coating

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Proceedings Article | 1 November 1997 Paper

Experimental multilayer survey in the VUV

Franz Schaefers, Hans-Christoph Mertins, M. Mertin, Ingo Packe, F. Schmolla, Silvia Di Fonzo, G. Soullie, Werner Jark, Hans Grimmer, Peter Boeni, Daniel Clemens, Michael Horisberger, Nikolai Salashchenko, E. Shamov

Proceedings Volume 3152, (1997) https://doi.org/10.1117/12.295560

KEYWORDS: Reflectivity, Absorption, Chromium, X-rays, Mirrors, Synchrotron radiation, Polarimetry, Sensors, Iron, Nickel

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Proceedings Article | 22 November 1996 Paper

Laterally graded Si1-xGex crystals for high-resolution synchrotron x-ray optics

Alexei Erko, Franz Schaefers, Wolfgang Gudat, K. Sawhney, Nikolai Abrosimov, S. Rossolenko, V. Alex, S. Groth, W. Schroeder

Proceedings Volume 2856, (1996) https://doi.org/10.1117/12.259855

KEYWORDS: Crystals, Silicon, Germanium, Laser crystals, X-rays, Monochromators, Synchrotron radiation, Reflection, X-ray optics, Diffraction

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Proceedings Article | 25 September 1995 Paper

X-ray supermirrors for BESSY-II

Alexei Erko, Franz Shaefers, Bernard Vidal, Andrey Yakshin, Pierre Chevallier

Proceedings Volume 2516, (1995) https://doi.org/10.1117/12.221674

KEYWORDS: X-rays, Reflectivity, Mirrors, Synchrotron radiation, Silicon, Grazing incidence, Absorption, Hard x-rays, Chlorine, Vacuum ultraviolet

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Proceedings Article | 15 February 1994 Paper

Measurement of circular polarization close to the carbon K-edge using a transmission multilayer

Franz Schaefers, Helmuth Petersen, Andreas Gaupp, S. DiFonzo, Werner Jark, James Underwood

Proceedings Volume 2010, (1994) https://doi.org/10.1117/12.168590

KEYWORDS: Carbon, Polarization, Phase shifting, Phase shifts, X-rays, Polarimetry, Optical components, X-ray optics, Reflectivity, Silicon

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Proceedings Article | 15 February 1994 Paper

Circular polarization measurements at the BESSY crossed field undulator

Johannes Bahrdt, Andreas Gaupp, William Peatman, Franz Schaefers, Ch. Wang

Proceedings Volume 2010, (1994) https://doi.org/10.1117/12.168577

KEYWORDS: Polarization, Magnetism, Modulators, Polarimetry, Monochromators, Sensors, Electron beams, Optical components, Photon polarization, X-rays

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Proceedings Article | 20 January 1993 Paper

Characterization of YB66 for use as a soft x-ray monochromator crystal

Zofia Rek, Jen Nan Wong, T. Tanaka, Y. Kamimura, Franz Schaefers, Bert Muller, Michael Krumrey, P. Muller

Proceedings Volume 1740, (1993) https://doi.org/10.1117/12.138699

KEYWORDS: Crystals, X-rays, Monochromators, Synchrotron radiation, Laser crystals, Reflectivity, X-ray characterization, Synchrotrons, Interfaces, Ions

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Proceedings Article | 10 June 1992 Paper

Small d-spacing multilayer structures for the photon energy range E > 0.3 keV

S. Andreev, B. Mueller, Yuriy Platonov, Nicolay Polushkin, Nikolai Salashchenko, Franz Schaefers, S. Shinkarev, Dmitrii Simanovski, S. Zuev

Proceedings Volume 1800, (1992) https://doi.org/10.1117/12.60679

KEYWORDS: Reflectivity, X-rays, Diffraction, Plasma, Crystals, Spherical lenses, Modulation, X-ray optics, Interfaces, Mirrors

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Showing 5 of 21 publications

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