Dr. Friedrich Koenig
Sr Research and Development Manager at Merck KGaA
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 February 2004 Paper
Henrik Ehlers, Karl-Josef Becker, Rudolf Beckmann, Nils Beermann, Ulf Brauneck, Peter Fuhrberg, Dieter Gaebler, Stefan Jakobs, Norbert Kaiser, Michael Kennedy, Friedrich Koenig, Sven Laux, Juergen Christian Mueller, Bernd Rau, Werner Riggers, Detlev Ristau, Dieter Schaefer, Olaf Stenzel
Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.514817
KEYWORDS: Ions, Plasma, Niobium, Refractive index, Deposition processes, Resolution enhancement technologies, Coating, Prototyping, Oxygen, Absorption

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