Dr. Hao D. Xiong Profile

Dr. Hao D. Xiong

at Vanderbilt Univ

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Author

Publications (2)

Proceedings Article | 23 May 2005 Paper

1/f noise in SOI buried oxides and alternative dielectrics to SiO2

Daniel Fleetwood, Hao Xiong, Jonathan Lin

Proceedings Volume 5844, (2005) https://doi.org/10.1117/12.609720

KEYWORDS: Oxides, Transistors, Silicon, Semiconducting wafers, Dielectrics, Aluminum, Measurement devices, Molybdenum, Field effect transistors, Annealing

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Proceedings Article | 12 May 2003 Paper

Low-frequency noise and radiation response of buried oxides in SOI nMOS transistors

Hao Xiong, Daniel Fleetwood, James Schwank

Proceedings Volume 5113, (2003) https://doi.org/10.1117/12.487870

KEYWORDS: Oxides, Semiconducting wafers, Temperature metrology, Transistors, Molybdenum, Radiation effects, Field effect transistors, Silicon, Measurement devices, Diffusion

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