Prof. Huimin Xie Profile

Prof. Huimin Xie

Professor at Tsinghua Univ

SPIE Involvement:

Author

Proceedings Article | 24 July 2018 Paper

Determination of the moiré spacing in sampling moiré method based on the generation mechanism of sampling moiré

Qi Zhang, Huimin Xie

Proceedings Volume 10827, 1082724 (2018) https://doi.org/10.1117/12.2326950

KEYWORDS: Phase shifting, Analytical research, Experimental mechanics

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Proceedings Article | 13 June 2017 Paper

Nondestructive identification of defects in additive manufacturing (AM) structures using continuous phase-shifted coherent gradient sensing method

Kang Ma, Huimin Xie

Proceedings Volume 10449, 1044906 (2017) https://doi.org/10.1117/12.2268375

KEYWORDS: Reflectivity, Nondestructive evaluation, Additive manufacturing, Turbulence, Spatial resolution, Inspection, 3D scanning, 3D printing, Printing, Optical resolution

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SPIE Journal Paper | 17 May 2017

Methodology for microscale deformation measurement of free-standing thin films

Dan Wu, Huimin Xie, Rong Wang

OE, Vol. 56, Issue 05, 054105, (May 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.5.054105

KEYWORDS: Thin films, Fabrication, Ion beams, Etching, Scanning electron microscopy, Microscopes

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Proceedings Article | 22 June 2015 Paper

Modified coherent gradient sensing method for slope measurement of reflective surfaces

Kang Ma, Huimin Xie

Proceedings Volume 9525, 95251P (2015) https://doi.org/10.1117/12.2184444

KEYWORDS: Phase shifting, Fringe analysis, Reflectivity, Error analysis, Reflection, Ions, Interferometry, Mechanical sensors, Numerical analysis, Thin films

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SPIE Journal Paper | 9 April 2015

Reconstruction of planar periodic structures based on Fourier analysis of moiré patterns

Ronghua Zhu, Huimin Xie, Minjin Tang, Chuanwei Li, Dan Wu

OE, Vol. 54, Issue 04, 044102, (April 2015) https://doi.org/10.1117/12.10.1117/1.OE.54.4.044102

KEYWORDS: Scanning electron microscopy, Raster graphics, Fringe analysis, Calibration, Microscopes, Optical engineering, Superposition, Fourier transforms, Silicon, Image processing

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Proceedings Article | 13 November 2014 Paper

High-frequency deformation grating fabrication techniques and applications

Xianglu Dai, Yanjie Li, Huimin Xie

Proceedings Volume 9276, 927625 (2014) https://doi.org/10.1117/12.2074671

KEYWORDS: Electron beam lithography, Fabrication, Holography, Optical lithography, Metals, Deflectometry, Electron beams, Lithography, Nanoimprint lithography, Microscopes

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SPIE Journal Paper | 18 November 2013

High-accuracy magnification calibration for a microscope based on an improved discrete Fourier transform

Xianglu Dai, Huimin Xie, Chuanwei Li, Zhu Wu, Hongxia Geng

OE, Vol. 52, Issue 11, 114102, (November 2013) https://doi.org/10.1117/12.10.1117/1.OE.52.11.114102

KEYWORDS: Calibration, Microscopes, Fourier transforms, Scanning electron microscopy, Image processing, Optical engineering, Mechanics, Electron microscopes, Optical microscopes, Chemical species

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Proceedings Article | 25 August 2009 Paper

Elastic constant and fracture toughness measurement of bamboo charcoal using digital speckle correlation method

Huaixi Wang, Shaopeng Ma, Dongsheng Zhang, Huimin Xie

Proceedings Volume 7375, 737553 (2009) https://doi.org/10.1117/12.839330

KEYWORDS: Speckle, Silicon carbide, Atrial fibrillation, Imaging systems, Manufacturing, Mechanics, Experimental mechanics, Digital image correlation, Image processing, Correlation function

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SPIE Journal Paper | 1 March 2007

Full-field strain measurement using a two-dimensional Savitzky-Golay digital differentiator in digital image correlation

Bing Pan, Huimin Xie, Zhiqing Guo, Tao Hua

OE, Vol. 46, Issue 03, 033601, (March 2007) https://doi.org/10.1117/12.10.1117/1.2714926

KEYWORDS: Seaborgium, Digital image correlation, Optical engineering, Correlation function, Digital filtering, Optical filters, Finite element methods, Mechanics, Filtering (signal processing), Speckle

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Proceedings Article | 27 April 2006 Paper

Fabrication technique of nanograting using AFM

Huimin Xie, Zhanwei Liu, Ming Zhang, Wei Zhang, Anand Asundi

Proceedings Volume 6188, 618807 (2006) https://doi.org/10.1117/12.663058

KEYWORDS: Nanolithography, Fabrication, Atomic force microscope, Phase shifting, Mechanics, Manufacturing, Silicon, Atomic force microscopy, Nanotechnology, Aerospace engineering

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Proceedings Article | 12 April 2005 Paper

Spatially sampling effect on fringe phase-shifting detection

Bing Zhao, Huimin Xie, Anand Asundi

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621507

KEYWORDS: Signal to noise ratio, Phase measurement, Phase shifts, Fringe analysis, Quantization, Signal attenuation, Modulation, Interference (communication), Mechanics, Error analysis

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Proceedings Article | 12 April 2005 Paper

Micro/nano grating and its application to moiré measurement

Huimin Xie, Zhanwei Liu, Haixia Shang, Qikun Xue, Jinfeng Jia, Daining Fang

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621896

KEYWORDS: Lithography, Aluminum, Scanning probe microscopy, Fabrication, Metals, Molecular beam epitaxy, Crystals, Scanning tunneling microscopy, Nanolithography, Atomic force microscopy

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Proceedings Article | 12 April 2005 Paper

Uncertainty principle and fringe image processing

Bing Zhao, Huimin Xie, Anand Asundi

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621666

KEYWORDS: Spatial resolution, Fringe analysis, Phase measurement, Modulation, Fourier transforms, Phase shifting, Signal processing, Signal detection, Image processing, Frequency modulation

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Proceedings Article | 3 October 2003 Paper

Micro/nano moire methods

Anand Asundi, Haixia Shang, Huimin Xie, Biao Li

Proceedings Volume 5145, (2003) https://doi.org/10.1117/12.500902

KEYWORDS: Atomic force microscopy, Scanning electron microscopy, Moire patterns, Microelectromechanical systems, Mica, Crystals, Mechanics, Spatial resolution, Scanners, Electronic components

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