Hung-Wei Hsu
at National Taiwan Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 April 2023 Poster + Paper
Proceedings Volume 12496, 124962J (2023) https://doi.org/10.1117/12.2657818
KEYWORDS: Silicon, Electromagnetism, Reflectometry, Reflection, Finite-difference time-domain method, Reflectance spectroscopy, Semiconducting wafers, Etching

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