Dr. Jack D. Piercy Profile

Dr. Jack D. Piercy

at Dublin Institute for Advanced Studies

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 29 August 2022 Presentation + Paper

High-uniformity TiN/Ti/TiN multilayers for the development of Microwave Kinetic Inductance Detectors

Mario De Lucia, E. Baldwin, G. Ulbricht, J. Piercy, O. Creaner, C. Bracken, T. Ray

Proceedings Volume 12191, 1219105 (2022) https://doi.org/10.1117/12.2626867

KEYWORDS: Superconductors, Resonators, Inductance, Resistance, Titanium, Sensors, Multilayers, Temperature metrology

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Proceedings Article | 29 August 2022 Presentation + Paper

Repurposing ROACH-1 boards for prototyping of readout systems for optical-NIR MKIDs

Oisín Creaner, Colm Bracken, Jack Piercy, Gerhard Ulbricht, Eoin Baldwin, Mario De Lucia, Tom Ray

Proceedings Volume 12191, 1219112 (2022) https://doi.org/10.1117/12.2626985

KEYWORDS: Prototyping, Software development, Binary data, Inductance, Temporal resolution, Sensors, Resonators, Photodetectors, Multiplexing, Astronomical detectors, Astronomical instrumentation, Astronomical software, Spectral resolution, Spatial resolution

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Proceedings Article | 29 August 2022 Presentation

Performance of photon counting, optical to near-IR Microwave Kinetic Inductance Detectors utilizing proximity effects in Ti / TiN multilayers

Gerhard Ulbricht, Mario De Lucia, Eoin Baldwin, Jack Piercy, Oisin Creaner, Colm Bracken, Tom Ray

Proceedings Volume 12191, 1219106 (2022) https://doi.org/10.1117/12.2626869

KEYWORDS: Multilayers, Tin, Sensors, Photon counting, Microwave radiation, Inductance, Superconductors, Image resolution, Technetium, Single photon

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Proceedings Article | 27 August 2022 Poster + Paper

Monte Carlo transmission line modelling of multilayer optical coatings for performance sensitivity of a dichroic filter for the ARIEL space telescope

Vinooja Thurairethinam, Giorgio Savini, Mario De Lucia, Gerhard Ulbricht, Gary Hawkins, Eoin Baldwin, Deirdre Coffey, Jack Piercy, Tom Ray

Proceedings Volume 12180, 1218048 (2022) https://doi.org/10.1117/12.2629203

KEYWORDS: Multilayers, Refractive index, Optical coatings, Performance modeling, Thin films, Thin film coatings, Optical filters, Monte Carlo methods

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