James E. Ellenson
Research and Development Engineer at HP Inc
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 18 March 2009 Open Access Paper
Qiangfei Xia, W. Tong, W. Wu, J. Yang, X. Li, W. Robinett, T. Cardinali, M. Cumbie, J. Ellenson, P. Kuekes, R. S. Williams
Proceedings Volume 7271, 727106 (2009) https://doi.org/10.1117/12.814327
KEYWORDS: Nanoimprint lithography, Electrodes, Metals, Ultraviolet radiation, Reactive ion etching, Switching, Hybrid circuits, Optical lithography, CMOS technology, Nanowires

Proceedings Article | 30 October 2007 Paper
Proceedings Volume 6730, 67305Q (2007) https://doi.org/10.1117/12.753745
KEYWORDS: Nanoimprint lithography, Chemistry, Lithography, Polymers, Particles, Extreme ultraviolet lithography, Photomasks, Semiconductors, Ultraviolet radiation, Semiconducting wafers

Proceedings Article | 9 November 2005 Paper
Susan MacDonald, David Mellenthin, Kevin Rentzsch, Kenneth Kramer, James Ellenson, Tim Hostetler, Ron Enck
Proceedings Volume 5992, 599242 (2005) https://doi.org/10.1117/12.632269
KEYWORDS: Lithography, Semiconducting wafers, Vestigial sideband modulation, Electron beam lithography, Photomasks, Microelectromechanical systems, Transform theory, Manufacturing, Nanoimprint lithography, Optics manufacturing

Proceedings Article | 6 May 2005 Paper
William Tong, Scott Hector, Gun-Young Jung, Wei Wu, James Ellenson, Kenneth Kramer, Timothy Hostetler, Susan Richards, R. Williams
Proceedings Volume 5751, (2005) https://doi.org/10.1117/12.607236
KEYWORDS: Photomasks, Nanoimprint lithography, Optical lithography, Inspection, Optical alignment, Extreme ultraviolet lithography, Nanotechnology, Electron beam lithography, Lithography, Semiconductor manufacturing

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