Jan Till Schmieder
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 April 2021 Presentation + Paper
Proceedings Volume 11732, 1173204 (2021) https://doi.org/10.1117/12.2585734
KEYWORDS: Mid-IR, 3D metrology, Sensors, Infrared sensors, Time metrology, Translucency, Structured light, Stereoscopic cameras, Reflection, Optical properties

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