Dr. Martin Landmann
at Fraunhofer IOF
SPIE Involvement:
Conference Program Committee | Author
Publications (17)

Proceedings Article | 7 June 2024 Presentation + Paper
Proceedings Volume 13038, 1303804 (2024) https://doi.org/10.1117/12.3017783
KEYWORDS: Sensors, RGB color model, 3D metrology, Polarization, 3D modeling, Opacity, Cameras, Near infrared, Pose estimation, Image segmentation

Proceedings Article | 7 June 2024 Presentation + Paper
Proceedings Volume 13038, 130380D (2024) https://doi.org/10.1117/12.3013402
KEYWORDS: Glasses, Long wavelength infrared, Temperature distribution, 3D metrology, Reflection, Laser radiation, Cameras, Short wave infrared radiation, Thermal imaging cameras, Optical surfaces

Proceedings Article | 7 June 2024 Presentation + Paper
Proceedings Volume 13038, 1303803 (2024) https://doi.org/10.1117/12.3012571
KEYWORDS: 3D metrology, Diffractive optical elements, Cameras, Gas lasers, Beam diameter, Long wavelength infrared, 3D modeling, Thermography

Proceedings Article | 15 August 2023 Presentation + Paper
Proceedings Volume 12618, 126180H (2023) https://doi.org/10.1117/12.2673385
KEYWORDS: 3D metrology, Cameras, Thermography, 3D modeling, Temperature metrology, 3D image processing, Temperature distribution, Stereoscopic cameras, Optical spheres, Infrared cameras

Proceedings Article | 12 June 2023 Presentation + Paper
Proceedings Volume 12536, 125360P (2023) https://doi.org/10.1117/12.2663331
KEYWORDS: 3D metrology, Cameras, Long wavelength infrared, Mid-IR, Sensors, Time metrology, Gas lasers, 3D projection, 3D image processing, Spinel

Showing 5 of 17 publications
Conference Committee Involvement (7)
Dimensional Optical Metrology and Inspection for Practical Applications XIV
13 April 2025 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications XIII
24 April 2024 | National Harbor, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications XII
2 May 2023 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications XI
5 April 2022 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications X
12 April 2021 | Online Only, Florida, United States
Showing 5 of 7 Conference Committees
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