Jianyuan Ma
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 19 November 2021 Paper
Proceedings Volume 12059, 120591M (2021) https://doi.org/10.1117/12.2612769
KEYWORDS: Data modeling, Statistical modeling, Scattering, Diffraction, X-rays, Scatterometry, Convolution, Inverse problems, Metrology, Optics manufacturing

Proceedings Article | 19 November 2021 Paper
Proceedings Volume 12059, 120591K (2021) https://doi.org/10.1117/12.2612253
KEYWORDS: Scattering, 3D metrology, Diffraction, X-rays, 3D modeling, Computer architecture, Metrology, Transmission electron microscopy

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