Dr. Jigang Ma
SPIE Involvement:
Author
Profile Summary

Jigang Ma received Ph.D. degree in microelectronics in 2015. He had research experience in sub 10nm logic and emerging memory device characterization, variability and modeling.
He is currently a design Engineer to improve on-product performance, in ASML, Netherlands. His current research interests include on-product performance, process integration and patterning for future device technology node.
Publications (2)

Proceedings Article | 22 February 2021 Presentation + Paper
Proceedings Volume 11613, 116130J (2021) https://doi.org/10.1117/12.2584618
KEYWORDS: Optical alignment, Semiconducting wafers, Overlay metrology, Algorithm development, Semiconductor manufacturing, Scanners, Process control, Device simulation

Proceedings Article | 23 March 2020 Presentation + Paper
Jigang Ma, Miao Yu, Cees Lambregts, Sotirios Tsiachris, Paul Böcker, Jun-Yeob Kim, Won-Kwang Ma, Sang-Jun Han, Chan-Ha Park, Kyong-Seok Kim, Jung-Hwan Kim, Sang-Jun Park, Gwang-Gon Kim
Proceedings Volume 11327, 113270S (2020) https://doi.org/10.1117/12.2552938
KEYWORDS: Optical alignment, Overlay metrology, Semiconducting wafers, Deep ultraviolet, Scanners, Lithography, Sensors, Optimization (mathematics), Feedback control

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