Proceedings Article | 16 May 2013
KEYWORDS: Charge-coupled devices, Clocks, Laser damage threshold, Resistance, Pulsed laser operation, Laser countermeasures, Femtosecond phenomena, CCD cameras, Laser applications, Laser induced damage
Charged Coupled Devices (CCD) are widely used in military and security applications, such as airborne and ship based surveillance, satellite reconnaissance and so on. Homeland security requires effective means to negate these advanced overseeing systems. Researches show that CCD based EO systems can be significantly dazzled or even damaged by high-repetition rate pulsed lasers. Here, we report femto - second laser interaction with CCD camera, which is probable of great importance in future. Femto - second laser is quite fresh new lasers, which has unique characteristics, such as extremely short pulse width (1 fs = 10-15 s), extremely high peak power (1 TW = 1012W), and especially its unique features when interacting with matters. Researches in femto second laser interaction with materials (metals, dielectrics) clearly indicate non-thermal effect dominates the process, which is of vast difference from that of long pulses interaction with matters. Firstly, the damage threshold test are performed with femto second laser acting on the CCD camera. An 800nm, 500μJ, 100fs laser pulse is used to irradiate interline CCD solid-state image sensor in the experiment. In order to focus laser energy onto tiny CCD active cells, an optical system of F/5.6 is used. A Sony production CCDs are chose as typical targets. The damage threshold is evaluated with multiple test data. Point damage, line damage and full array damage were observed when the irradiated pulse energy continuously increase during the experiment. The point damage threshold is found 151.2 mJ/cm2.The line damage threshold is found 508.2 mJ/cm2.The full-array damage threshold is found to be 5.91 J/cm2. Although the phenomenon is almost the same as that of nano laser interaction with CCD, these damage thresholds are substantially lower than that of data obtained from nano second laser interaction with CCD. Then at the same time, the electric features after different degrees of damage are tested with electronic multi meter. The resistance values between clock signal lines are measured. Contrasting the resistance values of the CCD before and after damage, it is found that the resistances decrease significantly between the vertical transfer clock signal lines values. The same results are found between the vertical transfer clock signal line and the earth electrode (ground).At last, the damage position and the damage mechanism were analyzed with above results and SEM morphological experiments. The point damage results in the laser destroying material, which shows no macro electro influence. The line damage is quite different from that of point damage, which shows deeper material corroding effect. More importantly, short circuits are found between vertical clock lines. The full array damage is even more severe than that of line damage starring with SEM, while no obvious different electrical features than that of line damage are found. Further researches are anticipated in femto second laser caused CCD damage mechanism with more advanced tools. This research is valuable in EO countermeasure and/or laser shielding applications.
