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The design of the metrology system is presently at Engineering Model level, although it will be tested for performance in normal laboratory conditions.
In this work we will present the experimental setup and processing architecture designed for calibration and testing the OBM demonstrator close to operational conditions, namely in what respects to the distance from the OBM Optical Head to the fiducial plane (12 meter). This experimental setup is calibrated to reproduce verifiable fiducial displacements over the OBM telescope field of view at 7.5 micrometre level (1 sigma). This setup allows evaluating the performance of OBM and verify its compliance with requirements of the on-board metrology system for the Athena X-ray Observatory mission.
The Athena OBM system currently under development is based on the concept of a projective metrology where a pattern of active fiducials point sources is imaged onto an array detector. The position and orientation of the imaged pattern provides the necessary information to reconstruct the fiducial displacements with respect to the calibrated reference points, thus allowing obtaining an estimate of the pointing absolute knowledge error. In the present implementation, the fiducials shall be located close to the instrument’s detectors and will be imaged by a specially designed camera system located at the center of the Athena mirror. In this paper we will present the overall architecture and requirements of the metrology system under development for the Athena x-ray observatory mission.
Mode-locked Diode lasers are a very appealing technology for its inherent characteristics, associated to compactness, size and efficiency, constituting a positive trade-off with regard to other mode-locked laser sources. Nevertheless, main current drawback is the non-availability of frequency-stable laser diodes. The laser used is a monolithic mode-locked semiconductor quantum-dot (QD) laser. The laser PRF is locked to an external stabilized RF reference. In this work we will present some of the preliminary results and discuss the importance of the requirements related to laser PRF stability in the final metrology system accuracy.
Dual frequency sweeping interferometry with range-invariant accuracy for absolute distance metrology
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