Dr. Julia A. Sakamoto
Senior Computer Scientist
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | 30 March 2016
JM3, Vol. 15, Issue 02, 021402, (March 2016) https://doi.org/10.1117/12.10.1117/1.JMM.15.2.021402
KEYWORDS: Scanners, Optical proximity correction, Photomasks, Lithography, Metals, Error analysis, Overlay metrology, Semiconducting wafers, Statistical analysis, Optical lithography

Proceedings Article | 15 March 2016 Paper
Proceedings Volume 9780, 97800C (2016) https://doi.org/10.1117/12.2218146
KEYWORDS: Lithography, Optical lithography, Computational lithography, Optical proximity correction, Integrated circuit design, 193nm lithography, Performance modeling, Scanners, Optical design, Optical alignment, Semiconducting wafers, Monte Carlo methods, Image processing, Etching, Ions, Statistical analysis

Proceedings Article | 2 October 2015 Paper
Proceedings Volume 9630, 963007 (2015) https://doi.org/10.1117/12.2192040
KEYWORDS: Fourier transforms, Photomasks, Graphics processing units, Algorithm development, Lithography, Data processing, Transistors, Ions, Integrated circuits, Semiconducting wafers

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