Karla A. Romero
at AMD Saxony Mfg GmbH
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 21 March 2007 Paper
Russell Callahan, Gunter Grasshoff, Stefan Roling, Joseph Shannon, Asuka Nomura, Sarah McGowan, Cyrus Tabery, Karla Romero
Proceedings Volume 6521, 65211Q (2007) https://doi.org/10.1117/12.712161
KEYWORDS: Etching, Chemistry, Fluorine, Chlorine, Lithography, Bromine, Line edge roughness, Manufacturing, Semiconducting wafers, Optical proximity correction

Proceedings Article | 13 March 2006 Paper
Karla Romero, Rolf Seltmann, Gert Burbach, Rolf Stephan, Joerg Paufler, David Greenlaw
Proceedings Volume 6156, 61560D (2006) https://doi.org/10.1117/12.657131
KEYWORDS: Transistors, Critical dimension metrology, Optical lithography, Line edge roughness, Structural design, Image processing, Scanners, Monochromatic aberrations, Semiconducting wafers, Etching

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