Dr. Ken Vidar Falch
at Deutsches Elektronen-Synchrotron
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 October 2023 Presentation
Proceedings Volume PC12698, PC1269805 (2023) https://doi.org/10.1117/12.2675485
KEYWORDS: X-rays, X-ray imaging, Partial coherence, Signal detection, Optics manufacturing, Lithographic illumination, Lens arrays, Image restoration, Additive manufacturing, Time metrology

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