Mr. Lennart J. de Vreede Profile

Lennart J. de Vreede

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Author

Publications (4)

Proceedings Article | 20 November 2017 Open Access

Silicon pore optics for the international x-ray observatory

E. Wille, K. Wallace, M. Bavdaz, M. Collon, R. Günther, M. Ackermann, M. Beijersbergen, M. Riekerink, M. Blom, B. Lansdorp, L. de Vreede

Proceedings Volume 10565, 105652L (2017) https://doi.org/10.1117/12.2309240

KEYWORDS: Mirrors, X-rays, Silicon, Optics manufacturing, X-ray optics, Wafer-level optics, Manufacturing, Semiconducting wafers, Space telescopes, Spatial resolution

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Proceedings Article | 29 July 2010 Paper

Silicon pore x-ray optics for IXO

Maximilien Collon, Ramses Günther, Marcelo Ackermann, Rakesh Partapsing, Giuseppe Vacanti, Marco Beijersbergen, Marcos Bavdaz, Eric Wille, Kotska Wallace, Mark Olde Riekerink, Bob Lansdorp, Lennart de Vrede, Coen van Baren, Peter Müller, Michael Krumrey, Michael Freyberg

Proceedings Volume 7732, 77321F (2010) https://doi.org/10.1117/12.858166

KEYWORDS: Mirrors, Silicon, X-rays, X-ray optics, Optics manufacturing, Surface roughness, Particles, X-ray telescopes, Polishing, Semiconducting wafers

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Proceedings Article | 31 August 2009 Paper

Silicon pore optics development

Kotska Wallace, Marcos Bavdaz, Philippe Gondoin, Maximilien Collon, Ramses Günther, Marcelo Ackermann, Marco Beijersbergen, Mark Olde Riekerink, Marko Blom, Bob Lansdorp, Lennart de Vreede

Proceedings Volume 7437, 74370T (2009) https://doi.org/10.1117/12.825824

KEYWORDS: Mirrors, X-rays, Silicon, X-ray optics, Optics manufacturing, Telescopes, Semiconducting wafers, X-ray technology, Observatories, Spatial resolution

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Proceedings Article | 31 August 2009 Paper

Production of silicon mirror plates

Marinus Olde Riekerink, Bob Lansdorp, Lennart de Vreede, Marko Blom, Ronny van't Oever, Marcelo Ackermann, Maximilien Collon, Kotska Wallace, Marcos Bavdaz

Proceedings Volume 7437, 74370U (2009) https://doi.org/10.1117/12.825960

KEYWORDS: Silicon, Mirrors, Reflectivity, Optics manufacturing, Semiconducting wafers, Coating, Oxides, Manufacturing, Wafer-level optics, X-rays

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